David R. Tryon

Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.

? Tutorial for this page

Demo Data from VLDB 2026 / reviewers in the wild / expert

dblp:96/651 · DBLP profile ↗

← Back

2ranked-venue papers

1as first author

0since 2021 · last 1986

—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems

2 papers

Electronic design automation · 100%

Topics — the 5 heaviest of 5, each with the papers that count most for it

Topic	Papers	Last	Evidence papers
Electronic design automation › hardware verification and test › design for testability built-in self-test	1	1986	Self-testing with correlated faults · DAC 1986
Electronic design automation › hardware verification and test fault modeling	1	1986	Self-testing with correlated faults · DAC 1986
Electronic design automation hardware verification and test	1	1986	Self-testing with correlated faults · DAC 1986
Electronic design automation › hardware verification and test › timing verification statistical timing verification	1	1983	Statistical techniques of timing verification · DAC 1983
Electronic design automation › hardware verification and test timing verification	1	1983	Statistical techniques of timing verification · DAC 1983

Methods — techniques the papers use, named apart from their topics

approximation algorithm · 0.0statistical analysis · 0.0

Year	Publication	Venue	Position
1986	Self-testing with correlated faults abstract Accurate prediction of the number of self-test random patterns that will provide low defect levels is crucial. This prediction is complicated by fault-to-fault correlating effects. This paper presents a technique to assess the number of random patterns required to test to a given defect level in the presence of fault correlation. This paper will also develop approximation algorithms that enable test engineers to readily compute defect levels as a function of test coverage with correlated faults present. This paper thus enhances previous work which assumed fault-to-fault independence in determining random pattern sufficiency and defect levels. David R. Tryon	DAC	1
1983	Statistical techniques of timing verification James H. Shelly, David R. Tryon	DAC	2