Demo Data from VLDB 2026 / reviewers in the wild / expert
Mary Ann Kennedy
dblp:97/2089
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1989
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 2 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › fault diagnosis › fault model-based diagnosis
PMC model |
0.0 | 1 | 1989 | The PMC System Level Fault Model: Cardinality Properties of the Implied Faulty Sets · IEEE Trans. Computers 1989 |
Electronic design automation › hardware verification and test › fault diagnosis
system-level diagnosis |
0.0 | 1 | 1989 | The PMC System Level Fault Model: Cardinality Properties of the Implied Faulty Sets · IEEE Trans. Computers 1989 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1989 | The PMC System Level Fault Model: Cardinality Properties of the Implied Faulty SetsabstractOne aspect of the PMC system level fault model, the properties of the implied faulty sets, is considered. For tau -diagnosable systems that have at most tau faulty units, lower bounds on the cardinality of the maximal implied faulty sets are given. Then it is shown that these bounds are greatest lower bounds, and it is indicated how these results can be used in diagnosis algorithms.> Mary Ann Kennedy, Gerard G. L. Meyer |
IEEE Trans. Computers | 1 |