Demo Data from VLDB 2026 / reviewers in the wild / expert
Shreepad Karmalkar
dblp:99/11242
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 2012
0000-0002-6400-8955ORCID · reported
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 50% Integrated circuit design · 50% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
interconnect modeling |
0.1 | 1 | 2012 | Quasi-Static Compact Model for Coupling Between Aligned Contacts on Finite Substrates With Insulating or Conducting Backplanes · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2012 |
Integrated circuit design
substrate coupling |
0.1 | 1 | 2012 | Quasi-Static Compact Model for Coupling Between Aligned Contacts on Finite Substrates With Insulating or Conducting Backplanes · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2012 |
Methods — techniques the papers use, named apart from their topics
technology computer-aided design · 0.1quasi-static model · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2012 | Quasi-Static Compact Model for Coupling Between Aligned Contacts on Finite Substrates With Insulating or Conducting BackplanesabstractWe derive a closed-form quasi-static model for the coupling impedance between aligned coplanar rectangular contacts on bulk and epitaxial semiconductor substrates by resolving the 3-D field lines into simpler components (vertical, lateral, fringing, 2-D, etc.). Both insulating and conducting (grounded or floating) backplane conditions are considered. Our model reflects all the geometry and process parameters, and its constants are process independent and universal. The model also gives the capacitive coupling via ambient, i.e., via the region outside the substrate, and specifies conditions under which a given thickness or lateral extension of the substrate can be regarded as infinite. Comparisons with technology computer-aided design simulations and measurements validate the model over a wide range of width/length and width/separation ratios of the contacts. Komail M. H. Badami, Shreepad Karmalkar |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |