Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Shreepad Karmalkar

dblp:99/11242 · DBLP profile ↗
← Back
1ranked-venue papers
0as first author
0since 2021 · last 2012
0000-0002-6400-8955ORCID · reported

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 50% Integrated circuit design · 50%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
interconnect modeling
0.112012
Quasi-Static Compact Model for Coupling Between Aligned Contacts on Finite Substrates With Insulating or Conducting Backplanes · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2012
Integrated circuit design
substrate coupling
0.112012
Quasi-Static Compact Model for Coupling Between Aligned Contacts on Finite Substrates With Insulating or Conducting Backplanes · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2012

Methods — techniques the papers use, named apart from their topics

technology computer-aided design · 0.1quasi-static model · 0.1
YearPublicationVenuePosition
2012 Quasi-Static Compact Model for Coupling Between Aligned Contacts on Finite Substrates With Insulating or Conducting Backplanes
abstract
We derive a closed-form quasi-static model for the coupling impedance between aligned coplanar rectangular contacts on bulk and epitaxial semiconductor substrates by resolving the 3-D field lines into simpler components (vertical, lateral, fringing, 2-D, etc.). Both insulating and conducting (grounded or floating) backplane conditions are considered. Our model reflects all the geometry and process parameters, and its constants are process independent and universal. The model also gives the capacitive coupling via ambient, i.e., via the region outside the substrate, and specifies conditions under which a given thickness or lateral extension of the substrate can be regarded as infinite. Comparisons with technology computer-aided design simulations and measurements validate the model over a wide range of width/length and width/separation ratios of the contacts.
Komail M. H. Badami, Shreepad Karmalkar
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2