VLDB 2026 Research / reviewers in the wild / expert
Martin H. Graham
dblp:g/MartinGraham2 · also Martin Graham 0002
· DBLP profile ↗
3ranked-venue papers
3as first author
0since 2021 · last 1969
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 3 · 3 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
3 papers |
Hardware reliability and fault tolerance · 82% Memory systems · 11% Integrated circuit design · 8% |
Topics — the 5 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › error correction
error-correcting codes |
0.0 | 1 | 1969 | Error Correction in Batch-Fabricated Memories · IEEE Trans. Computers 1969 |
Hardware reliability and fault tolerance
memory reliability |
0.0 | 2 | 1969 | Error Correction in Batch-Fabricated Memories · IEEE Trans. Computers 1969 The Design of a Large Electrostatic Memory · IRE Trans. Electron. Comput. 1959 |
Hardware reliability and fault tolerance
memory yield enhancement |
0.0 | 1 | 1969 | Error Correction in Batch-Fabricated Memories · IEEE Trans. Computers 1969 |
Memory systems
random-access memory |
0.0 | 1 | 1959 | The Design of a Large Electrostatic Memory · IRE Trans. Electron. Comput. 1959 |
Hardware reliability and fault tolerance
reliability enhancement |
0.0 | 1 | 1959 | The Design of a Large Electrostatic Memory · IRE Trans. Electron. Comput. 1959 |
Methods — techniques the papers use, named apart from their topics
error-correcting codes · 0.0barrier grid electrostatic storage · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1969 | Error Correction in Batch-Fabricated MemoriesabstractError correcting codes can be used in memories to produce perfect storage modules from components with some defects. The calculations indicate that the additional complexity of using these codes may be very profitable in increasing the yields of integrated circuit memory arrays. Martin H. Graham |
IEEE Trans. Computers | 1 |
| 1959 | The Design of a Large Electrostatic MemoryabstractA large, high-speed random-access memory for the Brookhaven ``Merlin'' digital computer is described. This system employs barrier grid electrostatic storage tubes in a novel configuration yielding improved reliability. Basic design considerations are presented together with a description of circuitry and performance. Martin H. Graham, Gerald L. Miller, Howard R. Pate, Robert J. Spinrad |
IRE Trans. Electron. Comput. | 1 |
| 1956 | An Improved Method for Williams Storage
Martin H. Graham |
IRE Trans. Electron. Comput. | 1 |