Jon C. Muzio

dblp:m/JonCMuzio · DBLP profile ↗
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24ranked-venue papers
1as first author
0since 2021 · last 2007
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 23 · 1 first-authorArtificial intelligence and machine learning · 1Software engineering, systems software and programming languages · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
12 papers
Electronic design automation · 78% Emerging computing paradigms · 13% Integrated circuit design · 10%
Theoretical computer science
7 papers
Algorithms and data structures · 34% Computational complexity · 34% Coding theory · 27%

Topics — the 26 heaviest of 29, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.172000
Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits · IEEE Trans. Computers 2000
2-by-n Hybrid Cellular Automata with Regular Configuration: Theory and Application · IEEE Trans. Computers 1999
The analysis of one-dimensional linear cellular automata and their aliasing properties · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990
Emerging computing paradigms
cellular automata
0.021999
2-by-n Hybrid Cellular Automata with Regular Configuration: Theory and Application · IEEE Trans. Computers 1999
Analysis of One-Dimensional Linear Hybrid Cellular Automata over GF(q) · IEEE Trans. Computers 1996
Electronic design automation › hardware verification and test
fault detection
0.032000
Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits · IEEE Trans. Computers 2000
Testing Programmable Logic Arrays by Sum of Syndromes · IEEE Trans. Computers 1987
Spectral Fault Signatures for Internally Unate Combinational Networks · IEEE Trans. Computers 1983
Integrated circuit design › digital circuit design
multivalued logic circuit
0.012000
Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits · IEEE Trans. Computers 2000
Electronic design automation › logic synthesis
reed-muller expansion
0.012000
Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits · IEEE Trans. Computers 2000
Electronic design automation
logic synthesis
0.021996
Synthesis of one-dimensional linear hybrid cellular automata · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1996
Spectral Fault Signatures for Internally Unate Combinational Networks · IEEE Trans. Computers 1983
Electronic design automation › logic synthesis › technology mapping
FPGA technology mapping
0.011996
Notes on "Complexity of the lookup-table minimization problem for FPGA technology mapping" · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1996
Electronic design automation › logic synthesis
lookup-table minimization
0.011996
Notes on "Complexity of the lookup-table minimization problem for FPGA technology mapping" · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1996
Electronic design automation › hardware verification and test › test response compaction
signature analysis
0.021990
The analysis of one-dimensional linear cellular automata and their aliasing properties · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990
Space compaction for multiple-output circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988
Coding theory
linear feedback shift register
0.021999
2-by-n Hybrid Cellular Automata with Regular Configuration: Theory and Application · IEEE Trans. Computers 1999
Analysis of One-Dimensional Linear Hybrid Cellular Automata over GF(q) · IEEE Trans. Computers 1996
Electronic design automation › logic synthesis
logic minimization
0.011992
Boolean Matrix Transforms for the Minimization of Modulo-2 Canonical Expansions · IEEE Trans. Computers 1992
Electronic design automation › hardware verification and test › test response compaction
aliasing probability
0.011990
The analysis of one-dimensional linear cellular automata and their aliasing properties · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990
Electronic design automation › hardware verification and test › test response compaction
space compaction
0.011988
Space compaction for multiple-output circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988
Electronic design automation › hardware verification and test
test response compaction
0.011988
Space compaction for multiple-output circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988
Electronic design automation › hardware verification and test › VLSI testing
programmable logic array testing
0.011987
Testing Programmable Logic Arrays by Sum of Syndromes · IEEE Trans. Computers 1987
Electronic design automation › hardware verification and test › combinational circuit testing
syndrome testing
0.011987
Testing Programmable Logic Arrays by Sum of Syndromes · IEEE Trans. Computers 1987
Electronic design automation › hardware verification and test
fault modeling
0.011984
Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks · IEEE Trans. Computers 1984
Electronic design automation › hardware verification and test › fault modeling
stuck-at fault
0.011984
Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks · IEEE Trans. Computers 1984
Electronic design automation › hardware verification and test
test generation
0.011984
Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks · IEEE Trans. Computers 1984
Electronic design automation › hardware verification and test › fault detection
stuck-at fault detection
0.011983
Spectral Fault Signatures for Internally Unate Combinational Networks · IEEE Trans. Computers 1983
Automata and formal languages
cellular automata
0.011990
The analysis of one-dimensional linear cellular automata and their aliasing properties · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990
Electronic design automation › hardware verification and test › design for testability
built-in self-test
0.011988
Space compaction for multiple-output circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988
Integrated circuit design › VLSI design
cellular array
0.011977
Three Cell Structures for Ternary Cellular Arrays · IEEE Trans. Computers 1977
Integrated circuit design
digital circuit design
0.011977
Three Cell Structures for Ternary Cellular Arrays · IEEE Trans. Computers 1977
Electronic design automation › logic synthesis
combinational network
0.011983
Spectral Fault Signatures for Internally Unate Combinational Networks · IEEE Trans. Computers 1983
Combinatorics and discrete mathematics
switching theory
0.011977
Three Cell Structures for Ternary Cellular Arrays · IEEE Trans. Computers 1977

Methods — techniques the papers use, named apart from their topics

characteristic polynomial recursion · 0.0similarity transform · 0.0reduction proof · 0.0probabilistic synthesis algorithm · 0.0irreducible polynomial · 0.0reed-muller expansion · 0.0polynomial search algorithm · 0.0linear algebra · 0.0kronecker product · 0.0boolean matrix transforms · 0.0dyadic convolution · 0.0coding scheme · 0.0
YearPublicationVenuePosition
2007 A New Class of Cellular Automata
abstract
In this paper we present a new class of one-dimensional cellular automata which does not have the design complexity of two dimensional cellular automata but achieves higher fault coverage than the two most commonly used maximal length linear finite state machines: linear hybrid cellular automata and linear feedback shift registers. This class of cellular automata is based on a five-cell neighbourhood, giving it a much richer transition structure, but still keeping the interconnection complexity very low. A recurrence relation is given to enable the efficient calculation of the characteristic polynomial. The effectiveness of the new cellular automata is investigated by using them as generators for built-in self-test of the ISCAS 85 and ISCAS 89 benchmark circuits. While the resulting fault coverage is never worse than using the traditional linear feedback shift register as the generator, in about half of the circuits the fault coverage is significantly improved, in some cases by more than 20%.
Hosna Jabbari, Jon C. Muzio
DSD2
2006 Analyzing Fault Models for Reversible Logic Circuits
abstract
Reversible logic computing is a rapidly developing research area. Testing such circuits is obviously an important issue. In this paper, we consider a new fault model, labeled crosspoint faults, for reversible logic circuits. A randomized Automatic Test Pattern Generation algorithm targeting this specific kind of fault is introduced and analyzed. Simulation results show that the algorithm yields very good performance. The relationship between the crosspoint faults and stuck-at faults is also investigated. We show that the crosspoint fault model is a better fault model for reversible circuits since it dominates the traditional stuck-at fault model in most instances.
Jon C. Muzio
IEEE Congress on Evolutionary Computation2
2002 Use of the Autocorrelation Function in the Classification of Switching Functions
abstract
Four operations on switching functions are used to define a classification technique based on the autocorrelation function. The relationship between these classes and the well-known spectral classes is investigated, and a canonical representative for each class is proposed. It is thought that these classes will be of use in logic synthesis employing decision diagram representations for intermediate steps.
Jacqueline E. Rice, Jon C. Muzio
DSD2
2000 TOP: An Algorithm for Three-Level Optimization of PLDs
abstract
Summary form only given. Presents an heuristic algorithm TOP (Three-level Optimization of PLDs), targeting a three-level logic expression of type g/sub 1/ o g/sub 2/, where g/sub 1/ and g/sub 2/ are sum-of-products and "o" is a binary operation. Such an expression can be implemented by a three-level Programmable Logic Device (PLD) consisting of PLA 1 and PLA2, implementing the first two levels of logic, and a set of two-input logic expanders, implementing the third level. Each logic expander can be programmed to realize any function of two variables. PLDs of this type seem to give a good trade-off between the speed of a flat PLA and density of a multi-level network of PLAs. TOP chooses the functionality of the logic expanders so that the area of the PLAs is minimized.
Elena Dubrova, Peeter Ellervee, D. Michael Miller, Jon C. Muzio
DATE4
2000 Easily Testable Multiple-Valued Logic Circuits Derived from Reed-Muller Circuits
abstract
S.M. Reddy (1972) showed that the binary circuits realizing Reed-Muller canonical form are easily testable. In this paper, we extend Reddy's result to multiple-valued logic circuits, employing more than two discrete levels of signal. The electronic fabrication of such circuits became feasible due to the recent advances in integrated circuit technology. We show that, in the multiple-valued case, several new phenomena occur which allow us to asymptotically reduce the upper bound on the number of tests required for fault detection, but make the generation of tests harder.
Elena Dubrova, Jon C. Muzio
IEEE Trans. Computers2
1999 2-by-n Hybrid Cellular Automata with Regular Configuration: Theory and Application
abstract
This paper introduces a new class of two-dimensional linear cellular automata and derives a number of their properties. A recursive relation is proved which enables the characteristic polynomial to be efficiently calculated, and minimal cost, maximal length generators of this type are listed for sizes up to 500. A theoretical analysis of the two vector transition properties of the cellular automata is given and it is shown that, for testing sequential faults over a set of standard benchmarks, the two-dimensional cellular automata perform, on average, better than one-dimensional linear hybrid cellular automata, and much better than linear finite shift registers.
Kevin Cattell, Shujian Zhang, Micaela Serra, Jon C. Muzio
IEEE Trans. Computers4
1997 Partial Symmetry in Cellular Automata Rule Vectors
Kevin Cattell, Jon C. Muzio
J. Electron. Test.2
1996 The dangers of simplistic delay models
David Wessels, Jon C. Muzio
J. Electron. Test.2
1996 Analysis of One-Dimensional Linear Hybrid Cellular Automata over GF(q)
abstract
The paper studies theoretical aspects of one dimensional linear hybrid cellular automata over a finite (Galois) field. General results concerning the characteristic polynomials of such automata are presented. A probabilistic synthesis algorithm for determining such a linear hybrid cellular automaton with a specific characteristic polynomial is given, along with empirical results and a theoretical analysis. Cyclic boundary cellular automata are defined and related to the more common null boundary cellular automate. An explicit similarity transform between a cellular automaton and its corresponding linear feedback shift register is derived.
Kevin Cattell, Jon C. Muzio
IEEE Trans. Computers2
1996 Synthesis of one-dimensional linear hybrid cellular automata
abstract
This paper presents a method for the synthesis of a one-dimensional linear hybrid cellular automaton (CA) from a given irreducible polynomial. A detailed description of the algorithm is given, together with an outline of the theoretical background. It is shown that two CA exist for each irreducible polynomial, solving the previously open CA existence conjecture. An in-depth example of the synthesis is presented, along with timing benchmarks and an operation count. The algorithm solves the previously open problem of synthesizing CA for all practical applications.
Kevin Cattell, Jon C. Muzio
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2
1996 Notes on "Complexity of the lookup-table minimization problem for FPGA technology mapping"
abstract
For the original article see IEEE Trans. Computer-Aided Design, vol. 13, no. 11, p. 1319-32 (1994). In this paper, we prove that 3-RLMP and 4-RLMP, proposed by Farrahi and Sarrafzadeh in the aforementioned paper, are NP-complete.
Shujian Zhang, D. Michael Miller, Jon C. Muzio
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.3
1995 Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults
Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller
J. Electron. Test.3
1995 Evaluating the safety of self-checking circuits
Shujian Zhang, Jon C. Muzio
J. Electron. Test.2
1994 Why Cellular Automata are better than LFSRs as Built-in Self-test Generators for Sequential-type Faults
abstract
This paper presents a combinatorial method of evaluating the effectiveness of linear hybrid cellular automata (LHCA) and linear feedback shift registers (LFSR) as generators for stimulating faults requiring a pair of vectors. We provide a theoretical analysis and empirical comparisons to see why the LHCAs are better than the LFSRs as generators for sequential-type faults in a built-in self-test (BIST) environment. Based on the concept of a partner set, the method derives the number of distinct k-cell substate vectors which have 2/sup 2k/, 1/spl les/k/spl les/[n/2], transition capability for an n-cell LFSR and an n-cell LFSR with maximum length cycles. Simulation studies of the ISCAS85 benchmark circuits provide evidence of the effectiveness of the theoretical metric.>
Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller
ISCAS3
1993 On the testability of array structures for FFT computation
Chao Feng 0009, Jon C. Muzio, Fabrizio Lombardi
J. Electron. Test.2
1992 Boolean Matrix Transforms for the Minimization of Modulo-2 Canonical Expansions
abstract
Fast transforms for computing modulo-2 ring-sum canonical expansions of a Boolean function are described using Kronecker products of elementary Boolean matrices. These transforms unify and generalize existing ones in the literature. Previous algorithms which employ such transforms for finding a minimal fixed polarity expansion (FPE) are reviewed, analyzed, and extended to a minimal fixed basis expansion (FBE).>
Patrick Kam Lui, Jon C. Muzio
IEEE Trans. Computers2
1991 Constrained parity testing
Patrick Kam Lui, Jon C. Muzio
J. Electron. Test.2
1990 The analysis of one-dimensional linear cellular automata and their aliasing properties
abstract
It is shown how to construct a general linear hybrid cellular automaton (CA) such that it has a maximum length cycle, and how the aliasing properties of such automata compare with linear feedback shift registers (LFSRs) when used as signature analyzers. The construction is accomplished by formally demonstrating the isomorphism which binds this kind of CA to the LFSRs. Consequently, these CAs can be analyzed as linear machines. Linear algebraic techniques are then applied appropriately for the transformations, and a useful search algorithm is developed which, given an irreducible characteristic polynomial, finds a corresponding linear hybrid automaton. Such CAs are tabulated for all irreducible and primitive polynomials up to degree 16, plus a selection of others of higher degree. The behavior of a linear hybrid CA and that of its corresponding LFSR are similar-that is, they have the same cycle structure and only relabel the states. The aliasing properties, when they are used as signature analyzers, remain unchanged.>
Micaela Serra, Terry Slater, Jon C. Muzio, D. Michael Miller
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.3
1988 Space compaction for multiple-output circuits
abstract
A counting signature for multiple-output circuits is introduced. It implements both time compaction and space compaction, such that a single signature is derived for all outputs, using a simple scheme with suitable built-in implementation. It is shown that there exists testability criteria that show deterministically at design time, without full-fault simulation, whether a fault is testable by the signature. The computation of such criteria is straightforward, can be easily incorporated into a CAD system such that the testability results are directly available to the designer. The best current application of such a space-compacted signature is to PLAs (programmable logic arrays) and ROMs (read-only memories), where full testability of all single faults is achieved. Discussion, results, proofs, and examples are presented, including an initial comparison with multiple-input shift registers (MISRs).>
Micaela Serra, Jon C. Muzio
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2
1987 Testing Programmable Logic Arrays by Sum of Syndromes
abstract
Syndrome testing is a simple and effective fault detection technique applicable to many general circuits. It is particularly useful in two-level circuits, such as programmable logic arrays (PLA's). For a multiple-output network, like PLA's, existing methods test the individual syndromes for each function, where a fault should be detectable in at least one output. This paper shows that the weighted sum of syndromes of all the outputs covers all single stuck-at-faults, bridging faults, and cross-point faults. Primary input faults are also covered except in one special case which requires some preventive design for testability. This results in the use of one test to cover all single faults.
Micaela Serra, Jon C. Muzio
IEEE Trans. Computers2
1984 Spectral Fault Signatures for Single Stuck-At Faults in Combinational Networks
abstract
A method is described for the derivation of fault signatures for the detection of stuck-at faults in single-output combinational networks. These signatures consist of a set of values derived from the network. Any single stuck-at fault causes at least one value to change. The fault signatures developed are a generalization of syndrome testing. The technique is developed in the Rademacher-Walsh spectral domain but is easily implemented using conters and basic gates.
D. Michael Miller, Jon C. Muzio
IEEE Trans. Computers2
1983 Spectral Fault Signatures for Internally Unate Combinational Networks
abstract
A method is described for the derivation of fault signatures for certain classes or irredundant combinational networks. These signatures consist of a set of values derived from the network. Any stuck-at fault causes at least one of the values to change. The signatures provide complete fault detection for all single stuck-at faults. They are usually short and never contain more than n + 1 values for an n-input network.
D. Michael Miller, Jon C. Muzio
IEEE Trans. Computers2
1980 Composite Spectra and the Analysis of Switching Circuits
abstract
A method is given for the evaluation of the Rademacher–Walsh spectra of the Boolean sum, product, and EXCLUSIVE-OR of two functions without reintroducing the Rademacher–Walsh transform. The results are derived using a general coding scheme and depend heavily upon the use of a dyadic convolution operation.
Jon C. Muzio
IEEE Trans. Computers1
1977 Three Cell Structures for Ternary Cellular Arrays
abstract
Three particular cell structures are defined for use in ternary cellular arrays. Universal arrays for both general and symmetric functions are considered and the optimum size is found. Both optimal and nonoptimal universal arrays are given for these cases as well as arrays for the sum and carry functions for a ternary full adder.
J. A. Bate, Jon C. Muzio
IEEE Trans. Computers2