We present a novel method for surface reflectometry from a few observations of a scene under a single uniform spherical field of circularly polarized illumination. The method is based on a novel analysis of the Stokes reflectance field of circularly polarized spherical illumination and yields per-pixel estimates of diffuse albedo, specular albedo, index of refraction, and specular roughness of isotropic BRDFs. To infer these reflectance parameters, we measure the Stokes parameters of the reflected light at each pixel by taking four photographs of the scene, consisting of three photographs with differently oriented linear polarizers in front of the camera, and one additional photograph with a circular polarizer. The method only assumes knowledge of surface orientation, for which we make a few additional photometric measurements. We verify our method with three different lighting setups, ranging from specialized to off-the-shelf hardware, which project either discrete or continuous fields of spherical illumination. Our technique offers several benefits: it estimates a more detailed model of per-pixel surface reflectance parameters than previous work, it requires a relatively small number of measurements, it is applicable to a wide range of material types, and it is completely viewpoint independent.

Reflecting objects such as tea pots and glasses, but also diffusely reflecting objects such as a user's shirt, can be used to spy on confidential data displayed on a monitor. First, we show how reflections in the user's eye can be exploited for spying on confidential data. Second, we investigate to what extent monitor images can be reconstructed from the diffuse reflections on a wall or the user's clothes, and provide information-theoretic bounds limiting this type of attack. Third, we evaluate the effectiveness of several countermeasures. This substantially improves previous work (Backes et al., IEEE Symposium on Security & Privacy, 2008).

Abstract This paper presents a novel method for estimating specular roughness and tangent vectors, per surface point, from polarized second order spherical gradient illumination patterns. We demonstrate that for isotropic BRDFs, only three second order spherical gradients are sufficient to robustly estimate spatially varying specular roughness. For anisotropic BRDFs, an additional two measurements yield specular roughness and tangent vectors per surface point. We verify our approach with different illumination configurations which project both discrete and continuous fields of gradient illumination. Our technique provides a direct estimate of the per‐pixel specular roughness and thus does not require off‐line numerical optimization that is typical for the measure‐and‐fit approach to classical BRDF modeling.

We present a new 3D scanning method using modulated phase-shifting. Optical scanning of complex objects or scenes with significant global light transport, such as subsurface scattering, interreflections, volumetric scattering, etc. is a difficult task since the direct surface reflection will be mixed with the global illumination. The direct and global components can be effficiently separated using high frequency illumination which to some extend is done in traditional phase-shifting for 3D scanning. In this paper we introduce the concept of modulation based separation where a high frequency signal is multiplied on top of other signal. The modulated signal inherits the good separation properties of the high frequency signal and allows for removing artifacts due to global illumination. This technique can be used to clean up arbitrary projected signals, e.g. photographs as well as the sinusoid patterns used for phase-shifting. For the modulated phase-shifting, we propose a two-pass separation method exploiting high frequency patterns in two-dimensions that can filter out the global components much more completely than traditional one-pass separation methods. We demonstrate the effectiveness of our approach on a couple of scenes with significant subsurface scattering and interreflections.

Translucent objects pose a difficult problem for traditional structured light 3D scanning techniques. Subsurface scattering corrupts the range estimation in two ways: by drastically reducing the signal-to-noise ratio and by shifting the intensity peak beneath the surface to a point which does not coincide with the point of incidence. In this paper we analyze and compare two descattering methods in order to obtain reliable 3D coordinates for translucent objects. By using polarization-difference imaging, subsurface scattering can be filtered out because multiple scattering randomizes the polarization direction of light while the surface reflectance partially keeps the polarization direction of the illumination. The descattered reflectance can be used for reliable 3D reconstruction using traditional optical 3D scanning techniques, such as structured light. Phase-shifting is another effective descattering technique if the frequency of the projected pattern is sufficiently high. We demonstrate the performance of these two techniques and the combination of them on scanning real-world translucent objects.

We describe a simple and robust method for surface mesostructure acquisition. Our method builds on the observation that specular reflection is a reliable visual cue for surface mesostructure perception. In contrast to most photometric stereo methods, which take specularities as outliers and discard them, we propose a progressive acquisition system that captures a dense specularity field as the only information for mesostructure reconstruction. Our method can efficiently recover surfaces with fine-scale geometric details from complex real-world objects with a wide variety of reflection properties, including translucent, low albedo, and highly specular objects. We show results for a variety of objects including human skin, dried apricot, orange, jelly candy, black leather and dark chocolate.