Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Paul Kollaritsch

dblp:11/6108 · DBLP profile ↗
← Back
4ranked-venue papers
2as first author
0since 2021 · last 1993
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4 · 2 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 1 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
design representation
0.011989
A Unified Design Representation Can Work · DAC 1989
YearPublicationVenuePosition
1993 Efficient Floorplan Enumeration Using Dynamic Programming
Sharat Prasad, Paul Kollaritsch, P. Anirudhan, D. K. Hwang, Steve Lusky, R. Farrow
ISCAS2
1989 A Unified Design Representation Can Work
abstract
A unified design representation can work. This has always been considered impractical due to major problems of run time, space, tool interdependencies, and multiple representations. We have addressed these problems and found them tractable. We present our solutions to these problems, gained through the experience of developing the Droid design system.
Paul Kollaritsch, Steve Lusky, Doug Matzke, Derek Smith, Paul Stanford
DAC1
1988 CLAY: a malleable-cell multi-cell transistor matrix approach for CMOS LAYout synthesis
abstract
CLAY takes a netlist partitioned down to the transistor level, a technology file with an arbitrary number of metal layers, and constraints on aspect and I/O signal positions to produce mask geometries. CLAY attempts to capture, in software, layout knowledge at the transistor level (allowing variable-shaped cells including heights) and at the floorplan level for VLSI sized examples. CLAY compares well with standard cell and manual approaches.>
Paul Kollaritsch, Steve Lusky, Sharat Prasad, Neil Potter
ICCAD1
1988 Area evaluation metrics for transistor placement
abstract
The authors report a quantitative comparison of area evaluation metrics for CMOS transistor placement, along with a novel analysis technique to determine their absolute merit. The transistor placer TOPOLOGIZER was used to generate test case placements. The resolution of transistor placement algorithms based on metrics (e.g. simulated annealing, branch and bound) are limited to the resolution of the metric. The best metric studied was only able to correctly identify, with 90% accuracy, the better of two placements whose layout areas differed by more than 30%.>
Tom Shiple, Paul Kollaritsch, Derek Smith, Jonathan Allen
ICCD2