Demo Data from SIGIR 2026 / reviewers in the wild / expert
Paul Kollaritsch
dblp:11/6108
· DBLP profile ↗
4ranked-venue papers
2as first author
0since 2021 · last 1993
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 1 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
design representation |
0.0 | 1 | 1989 | A Unified Design Representation Can Work · DAC 1989 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1993 | Efficient Floorplan Enumeration Using Dynamic Programming
Sharat Prasad, Paul Kollaritsch, P. Anirudhan, D. K. Hwang, Steve Lusky, R. Farrow |
ISCAS | 2 |
| 1989 | A Unified Design Representation Can WorkabstractA unified design representation can work. This has always been considered impractical due to major problems of run time, space, tool interdependencies, and multiple representations. We have addressed these problems and found them tractable. We present our solutions to these problems, gained through the experience of developing the Droid design system. Paul Kollaritsch, Steve Lusky, Doug Matzke, Derek Smith, Paul Stanford |
DAC | 1 |
| 1988 | CLAY: a malleable-cell multi-cell transistor matrix approach for CMOS LAYout synthesisabstractCLAY takes a netlist partitioned down to the transistor level, a technology file with an arbitrary number of metal layers, and constraints on aspect and I/O signal positions to produce mask geometries. CLAY attempts to capture, in software, layout knowledge at the transistor level (allowing variable-shaped cells including heights) and at the floorplan level for VLSI sized examples. CLAY compares well with standard cell and manual approaches.> Paul Kollaritsch, Steve Lusky, Sharat Prasad, Neil Potter |
ICCAD | 1 |
| 1988 | Area evaluation metrics for transistor placementabstractThe authors report a quantitative comparison of area evaluation metrics for CMOS transistor placement, along with a novel analysis technique to determine their absolute merit. The transistor placer TOPOLOGIZER was used to generate test case placements. The resolution of transistor placement algorithms based on metrics (e.g. simulated annealing, branch and bound) are limited to the resolution of the metric. The best metric studied was only able to correctly identify, with 90% accuracy, the better of two placements whose layout areas differed by more than 30%.> Tom Shiple, Paul Kollaritsch, Derek Smith, Jonathan Allen |
ICCD | 2 |