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Chung-Hseng Kuo

dblp:126/2786 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1997
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 1 · 1 first-authorSystems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Embedded and real-time systems · 50% Electronic design automation · 50%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Embedded and real-time systems
cyber-physical system platforms
0.011997
Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems · ICRA 1997
Electronic design automation › hardware verification and test
fault diagnosis
0.011997
Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems · ICRA 1997
Embedded and real-time systems › manufacturing systems
flexible manufacturing systems
0.011997
Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems · ICRA 1997
Electronic design automation
statistical process control
0.011997
Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems · ICRA 1997

Methods — techniques the papers use, named apart from their topics

colored timed petri net · 0.0
YearPublicationVenuePosition
1997 Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems
abstract
The quality consistence and machine utilization of a flexible manufacturing system (FMS) strongly depend on the statistical process control (SPC) and the correct fault diagnosis of equipment. An FMS can be modelled by the colored timed Petri net (CTPN). However, most CTPN models of FMS lack the activities of SPC and fault diagnosis, and they lead to incomplete FMS CTPN models. In this paper, the CTPN-based SPC and fault diagnosis models are proposed to model the FMS SPC and fault diagnosis behaviors. Since the models depend on the measured data from the inspection machines and the sensor data from the devices, the CTPN-based SPC and fault diagnosis models can be incorporated into the production CTPN models to give a complete model of FMS activities. It is shown that the CTPN-based fault diagnosis is easy to model, and the results are straightforward.
Chung-Hseng Kuo, Han-Pang Huang
ICRA1