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Ali E. Kayaalp

dblp:130/4813 · DBLP profile ↗
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3ranked-venue papers
3as first author
0since 2021 · last 1990
0000-0002-8305-3073ORCID · corroborated

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 2 · 2 first-authorGraphics, computer vision, multimedia, augmented reality and games · 1 · 1 first-authorHuman-computer interaction and ubiquitous computing · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer graphics and multimedia
1 paper
Computational photography and imaging · 87% Image and video processing · 13%
Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Computational photography and imaging
3d scanning
0.011989
Scanning electron microscope based stereo analysis [for semiconductor IC inspection] · CVPR 1989
Computational photography and imaging › 3d vision
stereo image analysis
0.011989
Scanning electron microscope based stereo analysis [for semiconductor IC inspection] · CVPR 1989
Electronic design automation
hardware verification and test
0.011989
Scanning electron microscope based stereo analysis [for semiconductor IC inspection] · CVPR 1989

Methods — techniques the papers use, named apart from their topics

stereo correspondence · 0.0binary linear programming · 0.0
YearPublicationVenuePosition
1990 Scanning electron microscope-based stereo analysis
Ali E. Kayaalp, A. Ravishankar Rao, Ramesh Jain 0001
Mach. Vis. Appl.1
1990 Near real-time stereo range detection using a pipeline architecture
abstract
A pipeline architecture that performs near-real-time passive range detection using correlation-based binocular stereo vision is presented. A prototype system based on Datacube image processing boards running on a Sun-4 host has been configured specifically for this application. Using a disparity range of 64 pixels, the system matches 256*256 pixel stereo image pairs in approximately one second. Currently the system processes gray-scale images; modifications for processing color images at the same speed are underway. As the stereo system is running, the range information generated by it is processed and displayed on a high-resolution color monitor in various forms, using a TAAC-1 application accelerator board attached to the Sun-4 host system. The stereo matching algorithm, its hardware implementation, and show results are presented. In addition, extensions to the system for processing color images and research into future directions are discussed.>
Ali E. Kayaalp, James L. Eckman
IEEE Trans. Syst. Man Cybern.1
1989 Scanning electron microscope based stereo analysis [for semiconductor IC inspection]
abstract
A novel technique to analyze stereo images generated from a scanning electron microscope (SEM) for inspection of wafers for process control is presented. The two main features of this technique are that it uses a binary linear programming approach to set up and solve the correspondence problem, and that it uses constraints based on the physics of SEM image formation. Binary linear programming is a powerful tool with which to tackle constrained optimization problems, especially in the cases that involve matching between one data set and another. The authors also analyze the process of SEM image formation, and present constraints that are useful in solving the stereo correspondence problem. This technique has been solved on many images. Results for a few wafers are included.>
Ali E. Kayaalp, A. Ravishankar Rao, Ramesh Jain 0001
CVPR1