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V. D'Orangeville

dblp:135/5697 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 2013
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Databases, data management, data science and information retrieval · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Databases, data mining, and information retrieval
1 paper
Data mining · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Data mining
clustering
0.212013
Efficient Cluster Labeling for Support Vector Clustering · IEEE Trans. Knowl. Data Eng. 2013
Data mining › clustering › interpretable clustering
cluster labeling
0.212013
Efficient Cluster Labeling for Support Vector Clustering · IEEE Trans. Knowl. Data Eng. 2013
Data mining › clustering › kernel clustering
support vector clustering
0.212013
Efficient Cluster Labeling for Support Vector Clustering · IEEE Trans. Knowl. Data Eng. 2013

Methods — techniques the papers use, named apart from their topics

support vector clustering · 0.2critical point detection · 0.2
YearPublicationVenuePosition
2013 Efficient Cluster Labeling for Support Vector Clustering
abstract
We propose a new efficient algorithm for solving the cluster labeling problem in support vector clustering (SVC). The proposed algorithm analyzes the topology of the function describing the SVC cluster contours and explores interconnection paths between critical points separating distinct cluster contours. This process allows distinguishing disjoint clusters and associating each point to its respective one. The proposed algorithm implements a new fast method for detecting and classifying critical points while analyzing the interconnection patterns between them. Experiments indicate that the proposed algorithm significantly improves the accuracy of the SVC labeling process in the presence of clusters of complex shape, while reducing the processing time required by existing SVC labeling algorithms by orders of magnitude.
V. D'Orangeville, André Mayers, Ernest Monga, Shengrui Wang
IEEE Trans. Knowl. Data Eng.1