Demo Data from SIGIR 2026 / reviewers in the wild / expert
Philip G. Neudeck
dblp:158/2313
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 2002
—ORCID · unresolved
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design
high-temperature electronics |
0.0 | 1 | 2002 | High-temperature electronics - a role for wide bandgap semiconductors? · Proc. IEEE 2002 |
Integrated circuit design
power semiconductor devices |
0.0 | 1 | 2002 | High-temperature electronics - a role for wide bandgap semiconductors? · Proc. IEEE 2002 |
Methods — techniques the papers use, named apart from their topics
packaging · 0.0material growth · 0.0contact formation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2002 | High-temperature electronics - a role for wide bandgap semiconductors?abstractThe fact that wide bandgap semiconductors are capable of electronic functionality at much higher temperatures than silicon has partially fueled their development, particularly in the case of SiC. It appears unlikely that wide bandgap semiconductor devices will find much use in low-power transistor applications until the ambient temperature exceeds approximately 300/spl deg/C, as commercially available silicon and silicon-on-insulator technologies are already satisfying requirements for digital and analog VLSI in this temperature range. However practical operation of silicon power devices at ambient temperatures above 200/spl deg/C appears problematic, as self-heating at higher power levels results in high internal junction temperatures and leakages. Thus, most electronic subsystems that simultaneously require high-temperature and high-power operation will necessarily be realized using wide bandgap devices, once they become widely available. Technological challenges impeding the realization of beneficial wide bandgap high ambient temperature electronics, including material growth, contacts, and packaging, are briefly discussed. Philip G. Neudeck, Robert S. Okojie |
Proc. IEEE | 1 |