Copper microwire is an essential metal widely used in micro-electron mechanical systems. Since micro/nano material usually demonstrates unique mechanical properties due to scaling effect, copper microwire mechanical properties need to be investigated for better adhibition. Herein, we propose a nanorobotics manipulation system for copper microwire insitu twisting test. Firstly, a system with six degree-of-freedoms (DOFs) nanorobotic manipulator integrated inside scanning electron microscope (SEM) is introduced. Secondly, a positioning and assembly method for copper microwire specimen are proposed to solve the mismatching problem. Finally, the copper microwire is twisted in-situ and its properties are investigated and analyzed. The copper microwire sample fracture morphology shows a severe plastic deformation and being along with the emergence of deformation twin and intertwine, which exhibit strong scaling effects. This system provides a new method for in-situ twisting test, which paves the way for mechanical characterization inside SEM and benefits the fundamental nanomaterial research immensely.

Fault management is critical for efficiently supporting the increasing microgrids' penetration in distribution networks but remains an open problem. No existing ride through methods can ride through symmetrical and asymmetrical faults without increasing the fault current magnitude, meanwhile balancing microgrid power and eliminating double frequency ripples in microgrid inverters. The paper bridges this gap by contributing a novel active fault management (AFM) method. The new contributions include: 1) the development of a new conceptual AFM to control multiple variables during voltage dips; 2) the optimization-based AFM to coordinate different objectives according to a guidance and 3) a combined optimization and feedback control, during which optimization method provides the optimal trade-offs among different objectives and the feedback control ensures accurate realization of chosen operation points. Simulations with different types of faults prove that the developed AFM can achieve better trade-offs and coordination among various control objectives in comparison to the conventional ride through method.

Scanning electron microscope (SEM) has been widely used for characterization and manipulation in micro/nano field. However, existing SEMs can only provide images for samples from one single direction. This limitation sometimes would lead to misleading results. In order to provide multidirectional SEM imaging, a nanorobotic manipulation system with a rotation robot is designed and integrated with SEM. During the robot's rotation, samples fixed on the robot can be viewed by SEM from multi-direction, instead of one direction. The rotation robot is able to rotate 360° along one rotation axis. To facilitate the multidirectional imaging, an automatic alignment method is put forward. This automatic alignment is to align samples to the rotation robot's rotation axis, so that during rotation, samples wouldn't move out of SEM's field of view (FOV). Alignment results are given to justify the proposed alignment method. Magnetic wires have been observed from multi-direction to demonstrate the nanorobotic manipulation system's potential application in mic.ro/nano defect study.

Microscopy has been an indispensable tool for micro/nanosample imaging, manipulation, and characterization. However, viewing the micro/nanosample from multidirection is still a big challenge for current microscopy. To address the above issue, this paper proposes a novel nanorobotic manipulation system for the automatic alignment and multidirectional imaging under microscopes. First, a miniature rotation robot with three degrees of freedom is designed and integrated with a microscope. Then, a forward-backward alignment strategy containing three loops, i.e., position shift loop, angle loop, and magnification loop, is proposed to align the sample to the rotation axis of the robot automatically. After that, the sample is imaged from multidirection by rotating the robot with one revolution (360°). Finally, the alignment accuracy is evaluated and multi-directional images of various samples are implemented. This study provides a new way for the microscopic imaging, which is expected to exert a significant impact in multiple fields on a small scale, including microscopy imaging, microdefect detection, micromanipulation, in situ characterization, and so on.