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Lewis E. Miller

dblp:167/8609 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1984
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Computer networks · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 67% Hardware reliability and fault tolerance · 33%
Computer networks
1 paper
Optical networks · 100%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design
bipolar integrated circuit		 0.011984
Ultra-High Reliability Ultra-High Speed Silicon Integrated Circuits for Undersea Optical Communications Systems · IEEE J. Sel. Areas Commun. 1984
Integrated circuit design
high-speed integrated circuits		 0.011984
Ultra-High Reliability Ultra-High Speed Silicon Integrated Circuits for Undersea Optical Communications Systems · IEEE J. Sel. Areas Commun. 1984
Optical networks
submarine optical systems		 0.011984
Ultra-High Reliability Ultra-High Speed Silicon Integrated Circuits for Undersea Optical Communications Systems · IEEE J. Sel. Areas Commun. 1984
YearPublicationVenuePosition
1984 Ultra-High Reliability Ultra-High Speed Silicon Integrated Circuits for Undersea Optical Communications Systems
abstract
A line of ultra-high-speed ultra-high reliability integrated circuits have been designed for use in undersea optical communication systems. These are bipolar circuits using junction isolation and are realized in both standard buried collector, microwave junction isolated monolithic (MJIM) and microwave complementary bipolar integrated circuit (MCBIC) technology. The design of these circuits depends heavily on the technology used to realize the discrete transitors for undersea systems which are now deployed in a number of transoceanic locations. The reliability of the circuits is assured by application of the methodology distilled and refined from that used in previous undersea system developments. This paper summarizes how these previous developments have influenced the design of these circuits and presents the early reliability results within the context of the data accumulated in 20 years of monitoring undersea semiconductor device reliabilty.
Lewis E. Miller
 IEEE J. Sel. Areas Commun.1