Voltage noise and manufacturing process variation represent significant reliability challenges for modern microprocessors. Voltage noise is caused by rapid changes in processor activity that can lead to timing violations and errors. Process variation is caused by manufacturing challenges in low-nanometer technologies and can lead to significant heterogeneity in performance and reliability across the chip. To ensure correct execution under worst-case conditions, chip designers generally add operating margins that are often unnecessarily conservative for most use cases, which results in wasted energy. This paper investigates the combined effects of process variation and voltage noise on modern GPU architectures. A distributed power delivery and process variation model at functional unit granularity was developed and used to simulate supply voltage behavior in a multicore GPU system. We observed that, just like in CPUs, large changes in power demand can lead to significant voltage droops. We also note that process variation makes some cores much more vulnerable to noise than others in the same GPU. Therefore, protecting the chip against large voltage droops by using fixed and uniform voltage guardbands is costly and inefficient. This paper presents core tunneling, a variation-aware solution for dynamically reducing voltage margins. The system relies on hardware critical path monitors to detect voltage noise conditions and quickly reacts by clock-gating vulnerable cores to prevent timing violations. This allows a substantial reduction in voltage margins. Since clock gating is enabled infrequently and only on the most vulnerable cores, the performance impact of core tunneling is very low. On average, core tunneling reduces energy consumption by 15%.

This paper characterizes voltage noise in GPU architectures running general purpose workloads. In particular, it focuses on resonance-induced voltage noise, which is caused by workload-induced fluctuations in power demand that occur at the resonance frequency of the chip's power delivery network. A distributed power delivery model at functional unit granularity was developed and used to simulate supply voltage behavior in a GPU system. We observe that resonance noise can lead to very large voltage droops and protecting against these droops by using voltage guardbands is costly and inefficient. We propose EmerGPU, a solution that detects and mitigates resonance noise in GPUs. EmerGPU monitors workload activity levels and detects oscillations in power demand that approach resonance frequencies. When such conditions are detected, EmerGPU deploys a mitigation mechanism implemented in the warp scheduler that disrupts the resonance activity pattern. EmerGPU has no impact on performance and a small power cost. Reducing voltage noise improves system reliability and allows for smaller voltage margins to be used, reducing overall energy consumption by an average of 21%.

The pin count largely determines the cost of a chip package, which is often comparable to the cost of a die. In 3D processor-memory designs, power and ground (P/G) pins can account for the majority of the pins. This is because packages include separate pins for the disjoint processor and memory power delivery networks (PDNs). Supporting separate PDNs and P/G pins for processor and memory is inefficient, as each set has to be provisioned for the worst-case power delivery requirements. In this paper, we propose to reduce the number of P/G pins of both processor and memory in a 3D design, and dynamically and opportunistically divert some power between the two PDNs on demand. To perform the power transfer, we use a small bidirectional on-chip voltage regulator that connects the two PDNs. Our concept, called Snatch, is effective. It allows the computer to execute code sections with high processor or memory power requirements without having to throttle performance. We evaluate Snatch with simulations of an 8-core multicore stacked with two memory dies. In a set of compute-intensive codes, the processor snatches memory power for 30% of the time on average, speeding-up the codes by up to 23% over advanced turbo-boosting; in memory-intensive codes, the memory snatches processor power. Alternatively, Snatch can reduce the package cost by about 30%.

Lowering supply voltage is one of the most effective techniques for reducing microprocessor power consumption. Unfortunately, at low voltages, chips are very sensitive to process variation, which can lead to large differences in the maximum frequency achieved by individual cores. This paper presents Booster, a simple, low-overhead framework for dynamically rebalancing performance heterogeneity caused by process variation and application imbalance. The Booster CMP includes two power supply rails set at two very low but different voltages. Each core can be dynamically assigned to either of the two rails using a gating circuit. This allows cores to quickly switch between two different frequencies. An on-chip governor controls the timing of the switching and the time spent on each rail. The governor manages a “boost budget” that dictates how many cores can be sped up (depending on the power constraints) at any given time. We present two implementations of Booster: Booster VAR, which virtually eliminates the effects of core-to-core frequency variation in near-threshold CMPs, and Booster SYNC, which additionally reduces the effects of imbalance in multithreaded applications. Evaluation using PARSEC and SPLASH2 benchmarks running on a simulated 32-core system shows an average performance improvement of 11% for Booster VAR and 23% for Booster SYNC.

Power consumption is a primary concern for microprocessor designers. Lowering the supply voltage of processors is one of the most effective techniques for improving their energy efficiency. Unfortunately, low-voltage operation faces multiple challenges going forward. One such challenge is increased sensitivity to voltage fluctuations, which can trigger so-called “voltage emergencies” that can lead to errors. These fluctuations are caused by abrupt changes in power demand, triggered by processor activity variation as a function of workload. This paper examines the effects of voltage fluctuations on future many-core processors. With the increase in the number of cores in a chip, the effects of chip-wide activity fluctuation - such as that caused by global synchronization in multithreaded applications - overshadow the effects of core-level workload variability. Starting from this observation, we developed VRSync, a novel synchronization methodology that uses emergency-aware scheduling policies that reduce the slope of load fluctuations, eliminating emergencies. We show that VRSync is very effective at eliminating emergencies, allowing voltage guardbands to be significantly lowered, which reduces energy consumption by an average of 33%.

Stencil computations comprise the compute-intensive core of many scientific applications. The data access pattern of stencil computations often requires several adjacent data elements of arrays to be accessed in innermost parallel loops. Although such loops are vectorized by current compilers like GCC and ICC that target short-vector SIMD instruction sets, a number of redundant loads or additional intra-register data shuffle operations are required, reducing the achievable performance. Thus, even when all arrays are cache resident, the peak performance achieved with stencil computations is considerably lower than machine peak. In this paper, we present a hardware-based solution for this problem. We propose an extension to the standard addressing mode of vector floating-point instructions in ISAs such as SSE, AVX, VMX etc. We propose an extended mode of paired-register addressing and its hardware implementation, to overcome the performance limitation of current short-vector SIMD ISA's for stencil computations. Further, we present a code generation approach that can be used by a vectorizing compiler for processors with such an instructions set. Using an optimistic as well as a pessimistic emulation of the proposed instruction extension, we demonstrate the effectiveness of the proposed approach on top of SSE and AVX capable processors. We also synthesize parts of the proposed design using a 45nm CMOS library and show minimal impact on processor cycle time.

Energy efficiency is a primary concern for microprocessor designers. A very effective approach to improving the energy efficiency of a chip is to lower its supply voltage to very close to the transitor's threshold voltage, into what is called the near-thresold region. This reduces power consumption dramatically but also decreases reliability by orders of magnitude, especially for SRAM structures such as caches. This paper presents Parichute, a novel and powerful error correction technique based on turbo product codes that allows caches to continue to operate in near-threshold, while trading off some cache capacity to store error correction information. Our Parichute-based cache implementation is flexible, allowing protection to be disabled in error-free high voltage operation and selectively enabled as the voltage is lowered and the error rate increases. Parichute is also self-testing and variation-aware, allowing selective protection of cache sections that exhibit errors at higher supply voltages because of process variation. Parichute achieves significantly stronger error correction compared to prior cache protection techniques, enabling 2× to 4× higher cache capacity at low voltages. Our results also show that a system with a Parichute-protected L2 cache can achieve a 34% reduction in system energy (processor and DRAM) compared to a system operating at nominal voltage.