Demo Data from SIGIR 2026 / reviewers in the wild / expert
George A. Dainis III
dblp:201/1529
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1988
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 1 · 1 first-authorGraphics, computer vision, multimedia, augmented reality and games · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Artificial intelligence
1 paper |
Knowledge representation and reasoning · 100% | |
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 77% Integrated circuit design · 23% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Knowledge, reasoning and agents › Knowledge representation and reasoning › semantic representation
frame-based representation |
0.0 | 1 | 1988 | Rule-based inspection of leadframes [IC manufacture] · CVPR 1988 |
Knowledge, reasoning and agents › Knowledge representation and reasoning › knowledge-based systems › rule-based systems
rule-based reasoning |
0.0 | 1 | 1988 | Rule-based inspection of leadframes [IC manufacture] · CVPR 1988 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1988 | Rule-based inspection of leadframes [IC manufacture] · CVPR 1988 |
Integrated circuit design › semiconductor device fabrication
integrated circuit manufacturing |
0.0 | 1 | 1988 | Rule-based inspection of leadframes [IC manufacture] · CVPR 1988 |
Methods — techniques the papers use, named apart from their topics
rule-based inspection · 0.0frame-based representation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1988 | Rule-based inspection of leadframes [IC manufacture]abstractA description is given of progress toward implementing a rule-based visual inspection system. The target product for inspection is integrated-circuit lead frames. A frame-based representation system is used to describe the product and defect categories. The system uses three levels of visual inspection to identify generic and specific inspection targets and defect categories.> George A. Dainis III, Matthew O. Ward |
CVPR | 1 |