Demo Data from SIGIR 2026 / reviewers in the wild / expert
H. D. Park
dblp:201/1667
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1988
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 1 · 1 first-authorGraphics, computer vision, multimedia, augmented reality and games · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer graphics and multimedia
1 paper |
Multimedia analysis and retrieval · 77% Geometric modeling and processing · 23% | |
| Artificial intelligence
1 paper |
3D vision · 100% |
Topics — the 2 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Multimedia analysis and retrieval › image analysis › visual inspection
automated visual inspection |
0.0 | 1 | 1988 | CAD based planning and execution of inspection · CVPR 1988 |
Geometric modeling and processing › computer-aided design
CAD model |
0.0 | 1 | 1988 | CAD based planning and execution of inspection · CVPR 1988 |
Methods — techniques the papers use, named apart from their topics
rule-based planning · 0.0feature recognition · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1988 | CAD based planning and execution of inspectionabstractThe authors have created an interface between computer vision processes and CAD (computer-aided design) databases as part of the development of an automated visual inspection system. A recognition planning system uses rules to select the important vision features from the given CAD database and generates feature-recognition procedures. An inspection planning system provides overall inspection procedures given the CAD database. This system provides such information as a list of features to be measured, techniques to use, and the range of values allowed. Thus, after the design cycle, parts can be thoroughly inspected with no technical decisions or programming required.> H. D. Park, Owen Robert Mitchell |
CVPR | 1 |