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Torsten Loffler

dblp:202/4607 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 2007
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer networks
1 paper
Cellular and mobile networks · 77% Wireless sensing and localization · 23%
Interdisciplinary, comprehensive, and emerging computing
1 paper
Medical and health informatics · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Cellular and mobile networks › 6g
terahertz communication
0.112007
All-Optoelectronic Terahertz Imaging Systems and Examples of Their Application · Proc. IEEE 2007
Medical and health informatics
medical imaging
0.012007
All-Optoelectronic Terahertz Imaging Systems and Examples of Their Application · Proc. IEEE 2007
Wireless sensing and localization › terahertz sensing
terahertz spectroscopy
0.012007
All-Optoelectronic Terahertz Imaging Systems and Examples of Their Application · Proc. IEEE 2007
YearPublicationVenuePosition
2007 All-Optoelectronic Terahertz Imaging Systems and Examples of Their Application
abstract
We give an overview over several all-optoelectronic measurement systems which we have developed for transmittive and reflective imaging in the terahertz (THz) frequency range. The systems employ either pulsed or continuous-wave THz radiation. In both cases, they work on the basis of single-pixel scanning. Addressing the potential for imaging in the medical and dental field, and the application of THz radiation for industrial surface and interface characterization, we explore dark-field imaging where the imaging contrast originates from diffraction and scattering effects coming from topography or refractive-index variations.
Torsten Loffler, Karsten J. Siebert, Noboru Hasegawa, Tobias Hahn, Hartmut G. Roskos
Proc. IEEE1