Demo Data from SIGIR 2026 / reviewers in the wild / expert
Jae-San Kim
dblp:241/4285
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 2019
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 87% Memory systems · 13% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › reliability analysis
neural network reliability |
0.4 | 1 | 2019 | DRIS-3: Deep Neural Network Reliability Improvement Scheme in 3D Die-Stacked Memory based on Fault Analysis · DAC 2019 |
Hardware reliability and fault tolerance
soft errors |
0.4 | 1 | 2019 | DRIS-3: Deep Neural Network Reliability Improvement Scheme in 3D Die-Stacked Memory based on Fault Analysis · DAC 2019 |
Memory systems
3d-stacked memory |
0.1 | 1 | 2019 | DRIS-3: Deep Neural Network Reliability Improvement Scheme in 3D Die-Stacked Memory based on Fault Analysis · DAC 2019 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2019 | DRIS-3: Deep Neural Network Reliability Improvement Scheme in 3D Die-Stacked Memory based on Fault AnalysisabstractVarious studies have been carried out to improve the operational efficiency of the Deep Neural Networks (DNNs). However, the importance of the reliability in DNNs has generally been overlooked. As the underlying semiconductor technology decreases in reliability, the probability that some components of computing devices fail also increases, preventing high accuracy in DNN operations. To achieve high accuracy, ensuring operational reliability, even if faults occur, is necessary. Jae-San Kim, Joon-Sung Yang |
DAC | 1 |