Test technology development for processor-based Systems on a Chip (SoCs) has mainly focused on quality and cost of production test. More recently, test technologies that facilitate self test in the field of application are getting additional attention. Hardware-based built-in self test (BIST) is well understood for logic and for memory block, but can hardly cope with changing test strategies. We present a scalable test architecture based on a configurable test processor and a distributed modular scan controller that facilitates self test for logic and for bus structures and can optionally support externally controlled production test.

An optimized dequantization array is proposed for the Joint Photographers Expert Group (JPEG) scheme. The reconstruction error is minimized subjected to a regularity constraint. Both the peak-to-peak signal-to-noise ratio (PPSNR) and the visual quality are improved. In addition, the method reduces discontinuities in postprocessing such as edge detection. This approach is in full compliance with the JPEG standard.

In this paper, we describe a method by which language parsers and interpreters may be implemented in a lazy functional programming language. The visual appearance of such interpreters mimics the BNP description of the grammar of the language being interpreted. The method is particularly well suited to the implementation of language interpreters that are based on the principle of ‘rule to rule’ correspondence (in which each production rule of the grammar has a translation rule associated with it). The main objective of the paper is to demonstrate that the method described provides a useful framework within which both grammars and semantic theories of languages many be investigated. We present the method by example: the simple natural language interpreter we construct is based loosely on principles proposed by Richard Montague.