With the advancement of modern nanoscale technology nodes, Static Timing Analysis (STA) has become an indispensable technique for ensuring circuit reliability and performance across diverse process conditions. However, traditional STA methods scale poorly to the explosion of process corners in the nanoscale fabrication technology. Despite some seminal works in using AI to accelerate such processes, they either lack reliability or stability. To this end, we introduce ASAP, a novel approach addressing this challenge by combining both the latest deep learning methods and the classical Bayesian models to deliver scalable and accurate predictions with a self-calibration strategy to ensure reliability. Technically, the ASAP novelly integrates self-attention to help identify and prioritize crucial features under various input conditions and employs Neural Process to make confidence-based predictions for the final timing results. Furthermore, ASAP is equipped with Active Learning for self-refinement and self-correction. Experimental evaluations on benchmark circuits demonstrate that our method surpasses state-of-the-art work in STA accuracy by 18% in terms of prediction accuracy.

We propose a multi-corner multi-stage timing analysis prediction framework using a generalized linear model with latent features. We then further improve such methods using kernel trick extension, transfer learning with knowledge from previous designs, and multi-output feature engineering to deliver state-of-the-art (SOTA) prediction accuracy with very limited training data. Most importantly, our method is equipped with a Bayesian decision strategy to deliver reliable predictions with accuracy close to 100%, pushing the frontier of the machine-learning-based STA for practical implementation in the industry environment, where reliability is highly desired. Experimental results show that the accuracy of our proposed method outperforms the SOTA competitors by up to 4x and can improve prediction accuracy to 100% with little extra STA executions.