This work proposes a new problem of identifying large and tangled logic structures in a synthesized netlist. Large groups of cells that are highly interconnected to each other can often create potential routing hotspots that require special placement constraints. They can also indicate problematic clumps of logic that either require resynthesis to reduce wiring demand or specialized datapath placement. At a glance, this formulation appears similar to conventional circuit clustering, but there are two important distinctions. First, we are interested in finding large groups of cells that represent entire logic structures like adders and decoders, as opposed to clusters with only a handful of cells. Second, we seek to pull out only the structures of interest, instead of assigning every cell to a cluster to reduce problem complexity. This work proposes new metrics for detecting structures based on Rent's rule that, unlike traditional cluster metrics, are able to fairly differentiate between large and small groups of cells. Next, we demonstrate how these metrics can be applied to identify structures in a netlist. Finally, our experiments demonstrate the ability to predict and alleviate routing hotspots on a real industry design using our metrics and method.

With decreasing feature sizes, lowered supply voltages and increasing operating frequencies, the radiation tolerance of digital circuits is becoming an increasingly important problem. Many radiation hardening techniques have been presented in the literature for combinational as well as sequential logic. However, the radiation tolerance of clock generation circuitry has received scant attention to date. Recently, it has been shown that in the deep submicron regime, the clock network contributes significantly to the chip level Soft Error Rate (SER). The on-chip Phase Locked Loop (PLL) is particularly vulnerable to radiation strikes. In this paper, we present a radiation hardened PLL design. Each of the components of this design - the voltage controlled oscillator (VCO), the phase frequency detector (PFD) and the loop filter are designed in a radiation tolerant manner. Whenever possible, the circuit elements used in our PLL exploit the fact that if a gate is implemented using only PMOS (NMOS) transistors then a radiation particle strike can result only in a logic 0 to 1 (1 to 0) flip. By separating the PMOS and NMOS devices, and splitting the gate output into two signals, extreme high levels of radiation tolerance are obtained. Our PLL is tested for radiation immunity for critical charge values up to 250fC. Our results demonstrate that over a large number of radiation strikes on a number of sensitive nodes in our design, the worst case jitter is just 18%. In the worst case, our PLL returns to the locked state in 16 cycles of the VCO clock, after a radiation strike.