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Ajith Amerasekera

dblp:45/564 · DBLP profile ↗
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2ranked-venue papers
1as first author
0since 2021 · last 2010
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 2 · 1 first-authorSystems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 77% Integrated circuit design · 23%

Topics — the 1 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance › device reliability
electrostatic discharge
0.011993
ESD: a pervasive reliability concern for IC technologies · Proc. IEEE 1993

Methods — techniques the papers use, named apart from their topics

ESD testing · 0.0ESD modeling · 0.0
YearPublicationVenuePosition
2010 Ultra low power electronics in the next decade
abstract
We are seeing a shift in electronic technology from centralized and high-touch to ubiquitous and low-touch. Semiconductors are enabling intelligent systems to be developed that enable a more immersive environment expanding the role and applications of electronic technology. Driving this change is the availability of low-power electronics for wireless connectivity and performance processing. In the next decade, our ability to develop system-level solutions for energy management, delivery and consumption, will determine the extent to which the application space for electronic technology will grow. Power management techniques developed in the last decade have focused on process technology and circuit design techniques. As we move to distributed intelligent systems, power reductions of another few orders of magnitude are required. This talk looks at some of the key areas for innovation ranging from ultra-low power chips for personal and health technology to solutions for energy generation and delivery for autonomous systems.
Ajith Amerasekera
ISLPED1
1993 ESD: a pervasive reliability concern for IC technologies
abstract
Several aspects of ESD are described from the point of view of the test, design, product, and reliability engineering. A review of the ESD phenomena along with the test methods, the appropriate on-chip protection techniques, and the impact of process technology advances from CMOS to BiCMOS on the ESD sensitivity of IC protection circuits are presented. The status of understanding in the field of ESD failure physics and the current approaches for modeling are discussed.>
Charvaka Duvvury, Ajith Amerasekera
Proc. IEEE2