Demo Data from SIGIR 2026 / reviewers in the wild / expert
Aurelio Pellegrini
dblp:48/2849
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1996
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › analog and mixed-signal circuits
device modeling |
0.0 | 1 | 1996 | AC analysis of amorphous silicon devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1996 |
Integrated circuit design › semiconductor device modeling
thin-film transistor modeling |
0.0 | 1 | 1996 | AC analysis of amorphous silicon devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1996 |
Methods — techniques the papers use, named apart from their topics
continuity equation solution · 0.0ac analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1996 | AC analysis of amorphous silicon devicesabstractThe transport model in semiconductors is examined in the case where the effect of distributed gap states is significant like, e.g., in thin-film transistors. A solution scheme is derived for the two additional continuity equations accounting for the trapped charge such that, without loss of generality, the efficiency of the traditional method implemented in the existing device-analysis codes is kept. The dynamic effect of the trapped charge is then examined in the ac operation of a realistic thin-film device, including the analysis of the interelectrode capacitances. Aurelio Pellegrini, Luigi Colalongo, Marina Valdinoci, Massimo Rudan |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |