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Demo Data from SIGIR 2026 / reviewers in the wild / expert

Susan Lippincott Mack

dblp:62/4686 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2005
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 77% Integrated circuit design · 23%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
design for manufacturability		 0.112005
DFM rules! · DAC 2005
Integrated circuit design
nanometer technology		 0.012005
DFM rules! · DAC 2005
YearPublicationVenuePosition
2005 DFM rules!
abstract
For sub-100nm processes, predictions are putting initial process yields in the single digits. At the same time, at 130nm, we saw that two chips designed with the same methodology and same design rules could deliver completely different manufacturing yields.This panel will discuss the reasons for these phenomena and talk about future trends in DFM that will need to be addressed for success below 100nm.
Naveed A. Sherwani, Susan Lippincott Mack, Alex Alexanian, Premal Buch, Carlo Guardiani, Harold Lehon, Peter Rabkin, Atul Sharan
 DAC2