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Kuang-Wei Chiang

dblp:70/6395 · DBLP profile ↗
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6ranked-venue papers
6as first author
0since 2021 · last 1989
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 6 · 6 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
6 papers
Electronic design automation · 99% Integrated circuit design · 1%

Topics — the 14 heaviest of 15, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
physical design
0.031989
Time-efficient VLSI artwork analysis algorithms in GOALIE2 · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
Resistance Extraction and Resistance Calculation in GOALIE? · DAC 1989
Time Efficient VLSI Artwork Analysis Algorithms in GOALIE2 · DAC 1988
Electronic design automation › physical design
layout analysis
0.011989
Time-efficient VLSI artwork analysis algorithms in GOALIE2 · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
Electronic design automation › physical design
parasitic extraction
0.011989
Time-efficient VLSI artwork analysis algorithms in GOALIE2 · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
Electronic design automation › physical design › parasitic extraction
resistance extraction
0.011989
Resistance Extraction and Resistance Calculation in GOALIE? · DAC 1989
Electronic design automation › physical design
scanline algorithm
0.011989
Time-efficient VLSI artwork analysis algorithms in GOALIE2 · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
Electronic design automation
hardware verification and test
0.021984
Comments on "Fault Diagnosis of MOS Combinational Networks" · IEEE Trans. Computers 1984
On fault detection in CMOS logic networks · DAC 1983
Electronic design automation › physical verification
VLSI artwork analysis
0.011988
Time Efficient VLSI Artwork Analysis Algorithms in GOALIE2 · DAC 1988
Electronic design automation › hardware verification and test
fault diagnosis
0.011984
Comments on "Fault Diagnosis of MOS Combinational Networks" · IEEE Trans. Computers 1984
Electronic design automation › hardware verification and test
fault detection
0.011983
On fault detection in CMOS logic networks · DAC 1983
Electronic design automation
logic synthesis
0.011983
A Tree Representation of Combinational Networks · IEEE Trans. Computers 1983
Electronic design automation › hardware verification and test › fault detection
multiple fault detection
0.011984
Comments on "Fault Diagnosis of MOS Combinational Networks" · IEEE Trans. Computers 1984
Electronic design automation › hardware verification and test › fault testing
stuck-at fault testing
0.011984
Comments on "Fault Diagnosis of MOS Combinational Networks" · IEEE Trans. Computers 1984
Integrated circuit design › digital circuit design
CMOS circuit design
0.011983
On fault detection in CMOS logic networks · DAC 1983
Electronic design automation › hardware verification and test
hardware verification
0.011983
A Tree Representation of Combinational Networks · IEEE Trans. Computers 1983

Methods — techniques the papers use, named apart from their topics

trapezoid decomposition · 0.0scanline management · 0.0resistance calculation · 0.0artwork analysis algorithms · 0.0tree representation algorithm · 0.0matrix model for MOS complex gates · 0.0fault detection · 0.0
YearPublicationVenuePosition
1989 Resistance Extraction and Resistance Calculation in GOALIE?
Kuang-Wei Chiang
DAC1
1989 Time-efficient VLSI artwork analysis algorithms in GOALIE2
abstract
New algorithms used in the GOALIE2 circuit extraction system are presented that are based on representing VLSI layout geometries as trapezoids. These include polygon-to-trapezoid decomposition, scanline management, and output sorting. The scanline algorithm virtually eliminates the redundant computation present in similar systems. It solves the VLSI layout analysis problem in O(n+k) expected time and O( square root n) expected space, where n is the total number of input segments and k is the total number of intersection points. The new scanline algorithm is robust in what it will maintain its performance over a wide range of layout styles. Experimental results show that the running time is O(n/sup 1.0547/), i.e. that these algorithms enable one to perform VLSI layout analysis in nearly linear time.>
Kuang-Wei Chiang, Surendra Nahar, Chi-Yuan Lo
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
1988 Time Efficient VLSI Artwork Analysis Algorithms in GOALIE2
Kuang-Wei Chiang, Surendra Nahar, Chi-Yuan Lo
DAC1
1984 Comments on "Fault Diagnosis of MOS Combinational Networks"
abstract
This correspondence points out that the scope of application of the matrix model for MOS complex gates proposed by El-ziq and Su1does not cover general structures of this type. Also, an example is given to show that a complete detection test set for single stuck-at faults may not be able to detect all multiple faults in a fanout-free and irredundant MOS complex gate.
Kuang-Wei Chiang, Zvonko G. Vranesic
IEEE Trans. Computers1
1983 On fault detection in CMOS logic networks
Kuang-Wei Chiang, Zvonko G. Vranesic
DAC1
1983 A Tree Representation of Combinational Networks
abstract
A tree representation of a combinational network is developed. An algorithm is proposed for finding the functional expression realized by the network. The tree representation has storage requirement linear with respect to the number of input-output paths in the network. It is shown that rmding the complementary function and generating network SPOOF can be performed efficiently on the tree structure.
Kuang-Wei Chiang, Zvonko G. Vranesic
IEEE Trans. Computers1