Demo Data from SIGIR 2026 / reviewers in the wild / expert
John R. F. McMacken
dblp:77/6758
· DBLP profile ↗
2ranked-venue papers
2as first author
0since 2021 · last 1992
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 72% Integrated circuit design · 28% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › semiconductor device modeling
thin-film transistor modeling |
0.0 | 1 | 1992 | A numerical model for two-dimensional transient simulation of amorphous silicon thin-film transistors · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1992 |
Electronic design automation › circuit simulation
transient analysis |
0.0 | 1 | 1992 | A numerical model for two-dimensional transient simulation of amorphous silicon thin-film transistors · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1992 |
Electronic design automation
circuit simulation |
0.0 | 1 | 1989 | CHORD: a modular semiconductor device simulation development tool incorporating external network models · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989 |
Electronic design automation › technology computer-aided design
semiconductor device simulation |
0.0 | 1 | 1989 | CHORD: a modular semiconductor device simulation development tool incorporating external network models · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989 |
Electronic design automation › technology computer-aided design
device simulation |
0.0 | 1 | 1992 | A numerical model for two-dimensional transient simulation of amorphous silicon thin-film transistors · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1992 |
Methods — techniques the papers use, named apart from their topics
two-dimensional transient numerical simulation · 0.0linearized shockley-read-hall trapping · 0.0modified nodal analysis · 0.0byte-stream communication · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1992 | A numerical model for two-dimensional transient simulation of amorphous silicon thin-film transistorsabstractA model based on a linearized solution of the Shockley-Read-Hall trapping expressions is presented. It allows these equations to be eliminated from the system matrix. This results in significantly reduced memory requirements and execution times. To illustrate the approach, the switch-on and switch-off transients of a thin-film transistor were simulated. These results are compared with ones obtained from the full two-dimensional transient numerical model. It is shown that the linearized model can simulate a wide variety of device behavior, providing close agreement with the full model at a fraction of the cost.> John R. F. McMacken, Savvas G. Chamberlain |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 1989 | CHORD: a modular semiconductor device simulation development tool incorporating external network modelsabstractA description is given of CHORD, a semiconductor device simulation development tool created at the University of Waterloo. CHORD is written as several small independent programs which use a centralized database facility and is specifically designed to allow the simple creation, development, and testing of new simulation models and algorithms. Communication between programs is implemented by using a byte-stream process. This allows transfer of information between individual programs running on different machines. CHORD is a general environment in that its models can incorporate any set of user-defined variables of equations. This is illustrated by the development of contact boundary conditions incorporating external circuit elements and circuit-level device models using the modified nodal formulation. Several examples of both steady-state and transient simulations are presented.> John R. F. McMacken, Savvas G. Chamberlain |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |