Demo Data from SIGIR 2026 / reviewers in the wild / expert
Alp Arslan Bayrakci
dblp:82/4173
· DBLP profile ↗
7ranked-venue papers
5as first author
1since 2021 · last 2023
0000-0002-2824-036XORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 7 · 5 first-author · 1 since 2021Software engineering, systems software and programming languages · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 50% Performance modeling and evaluation · 50% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Performance modeling and evaluation › simulation › monte carlo simulation
importance sampling |
0.1 | 1 | 2010 | Fast Monte Carlo Estimation of Timing Yield With Importance Sampling and Transistor-Level Circuit Simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Performance modeling and evaluation › simulation
monte carlo simulation |
0.1 | 1 | 2010 | Fast Monte Carlo Estimation of Timing Yield With Importance Sampling and Transistor-Level Circuit Simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Electronic design automation › timing analysis
statistical timing analysis |
0.1 | 1 | 2010 | Fast Monte Carlo Estimation of Timing Yield With Importance Sampling and Transistor-Level Circuit Simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Electronic design automation › yield analysis
timing yield estimation |
0.1 | 1 | 2010 | Fast Monte Carlo Estimation of Timing Yield With Importance Sampling and Transistor-Level Circuit Simulation · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Methods — techniques the papers use, named apart from their topics
variance reduction · 0.1transistor-level simulation · 0.1importance sampling · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2023 | Delay based hardware Trojan detection exploiting spatial correlations to suppress variations
Fatma Nur Esirci, Alp Arslan Bayrakci |
Integr. | 2 |
| 2017 | Hardware Trojan detection based on correlated path delays in defiance of variations with spatial correlationsabstractHardware Trojan (HT) detection methods based on the side channel analysis deeply suffer from the process variations. In order to suppress the effect of the variations, we devise a method that smartly selects two highly correlated paths for each interconnect (edge) that is suspected to have an HT on it. First path is the shortest one passing through the suspected edge and the second one is a path that is highly correlated with the first one. Delay ratio of these paths avails the detection of the HT inserted circuits. Test results reveal that the method enables the detection of even the minimally invasive Trojans in spite of both inter and intra die variations with the spatial correlations. Fatma Nur Esirci, Alp Arslan Bayrakci |
DATE | 2 |
| 2016 | Accelerated Accurate Timing Yield Estimation Based on Control Variates and Importance SamplingabstractExtensive research has been conducted on a statistical timing analysis of digital integrated circuits in the existence of statistical parameter variations. However, the proposed methods either lack accuracy or efficiency, which avoids coming up with an industry standard tool. Despite this fact, there is a certain consensus that Monte Carlo (MC) methods are accurate, so that they are called golden. In this paper, we propose novel techniques to combine control variates with importance sampling in order to come up with a new timing yield estimator as accurate as SPICE-based standard MC (STD-MC) but much faster. The performance of three different estimators, two of which are proposed in this paper, is compared through experiments, and the results show that the precise SPICE simulation-based STD-MC method can be accelerated about 260× on the average without sacrificing any accuracy. Alp Arslan Bayrakci |
IEEE Trans. Very Large Scale Integr. Syst. | 1 |
| 2015 | Stochastic logical effort as a variation aware delay model to estimate timing yield
Alp Arslan Bayrakci |
Integr. | 1 |
| 2013 | On the accuracy of Monte Carlo yield estimatorsabstractSince the statistical timing analysis of VLSI circuits became a necessity, the accuracy of the proposed statistical static timing analysis (SSTA) methods is checked with the Monte Carlo (MC) estimation methods, which are called golden. However, the MC methods can have very different levels of accuracy depending on the model used beneath the method. In this paper, we build and compare three different MC yield estimators to see the effect of the models used beneath the estimator on the accuracy. Alp Arslan Bayrakci |
VLSI-SoC | 1 |
| 2010 | Fast Monte Carlo Estimation of Timing Yield With Importance Sampling and Transistor-Level Circuit SimulationabstractConsiderable effort has been expended in the electronic design automation community in trying to cope with the statistical timing problem. Most of this effort has been aimed at generalizing the static timing analyzers to the statistical case. On the other hand, detailed transistor-level simulations of the critical paths in a circuit are usually performed at the final stage of performance verification. We describe a transistor-level Monte Carlo (MC) technique which makes final transistor-level timing verification practically feasible. The MC method is used as a golden reference in assessing the accuracy of other timing yield estimation techniques. However, it is generally believed that it can not be used in practice as it requires too many costly transistor-level simulations. We present a novel approach to constructing an improved MC estimator for timing yield which provides the same accuracy as standard MC but at a cost of much fewer transistor-level simulations. This improved estimator is based on a unique combination of a variance reduction technique, importance sampling, and a cheap but approximate gate delay model. The results we present demonstrate that our improved yield estimator achieves the same accuracy as standard MC at a cost reduction reaching several orders of magnitude. Alp Arslan Bayrakci, Alper Demir 0001, Serdar Tasiran |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 2007 | Reduced Delay BCD AdderabstractFinancial and commercial applications use decimal data and spend most of their time in decimal arithmetic. Software implementation of decimal arithmetic is typically at least 100 times slower than binary arithmetic implemented in hardware. Therefore, hardware support for decimal arithmetic is required. In this paper, a reduced delay binary coded decimal (BCD) adder is proposed. The proposed adder improves the delay of BCD addition by increasing parallelism. On the critical-path of the proposed BCD adder, there are two 4-bit binary adders, a carry network, one AND gate, and one OR gate. To make area and delay comparison, the proposed adder and previously proposed five decimal adders are implemented in VHDL and synthesized using 0.18 micron TSMC ASIC library. Synthesis results obtained for 64-bit addition (16 decimal digits) show that the proposed BCD adder has the shortest delay (1.40 ns). Furthermore, it requires less area than previously proposed three decimal adders. Alp Arslan Bayrakci, Ahmet Akkas |
ASAP | 1 |