Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Nuria Torrado

dblp:93/8554 · DBLP profile ↗
← Back
1ranked-venue papers
1as first author
0since 2021 · last 2013
0000-0002-1156-3613ORCID · reported

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
1 paper
Software testing · 100%

Topics — the 1 heaviest of 1, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software testing › software reliability
software reliability modeling
0.212013
Software Reliability Modeling with Software Metrics Data via Gaussian Processes · IEEE Trans. Software Eng. 2013

Methods — techniques the papers use, named apart from their topics

gaussian process · 0.2deviance information criterion · 0.2bayesian inference · 0.2
YearPublicationVenuePosition
2013 Software Reliability Modeling with Software Metrics Data via Gaussian Processes
abstract
In this paper, we describe statistical inference and prediction for software reliability models in the presence of covariate information. Specifically, we develop a semiparametric, Bayesian model using Gaussian processes to estimate the numbers of software failures over various time periods when it is assumed that the software is changed after each time period and that software metrics information is available after each update. Model comparison is also carried out using the deviance information criterion, and predictive inferences on future failures are shown. Real-life examples are presented to illustrate the approach.
Nuria Torrado, Michael P. Wiper, Rosa E. Lillo
IEEE Trans. Software Eng.1