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John K. Gamelin

dblp:96/5931 · DBLP profile ↗
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2ranked-venue papers
0as first author
0since 2021 · last 1998
0009-0006-1258-2951ORCID · reported

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1Computer networks · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 33% Parallel and multicore computing · 33% Performance modeling and evaluation · 33%
Computer networks
1 paper
Optical networks · 100%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Optical networks
WDM networks
0.011998
The MONET New Jersey network demonstration · IEEE J. Sel. Areas Commun. 1998
Performance modeling and evaluation › numerical algorithms
finite difference time domain
0.011991
Massively parallel algorithms for scattering in optical lithography · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991
Parallel and multicore computing › parallel algorithms
massively parallel algorithms
0.011991
Massively parallel algorithms for scattering in optical lithography · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991

Methods — techniques the papers use, named apart from their topics

testbed demonstration · 0.0time-domain finite-difference method · 0.0electromagnetic scattering simulation · 0.0
YearPublicationVenuePosition
1998 The MONET New Jersey network demonstration
abstract
The multiwavelength optical networking (MONET) consortium has demonstrated national-scale optical networking in a multilocation testbed in New Jersey. The demonstration involves transparent optical connections over path lengths as long as 2290 km, through several network elements (NEs) controlled by two interoperating network control and management (NC&M) systems. This paper describes in detail the three constituent testbeds and the experiments.
L. D. Garrett, Richard M. Derosier, Alan H. Gnauck, A. McCormick, Robert W. Tkach, R. S. Vodhanel, J. C. Chiao, John K. Gamelin, C. A. Gibbins, H. Shirokmann, Michael E. Rauch, J. Young, R. E. Wagner, A. Luss, Mari Maeda, Jorge L. Pastor, Michael Post, Chien-Chung Shen, S. J. Wei, Brian J. Wilson 0001, Yukun Tsai, G. K. Chang, Sunita H. Patel, C. L. Allyn, Andrew R. Chraplyvy, J. Judkins, Atul K. Srivastava, James W. Sulhoff, A. M. Vengsarkar, C. Wolf, J. L. Zyskind, A. Chester, B. Comissiong, G. W. Davis, G. Duverney, Neil A. Jackman, A. Jozan, V. Nichols, B. H. Lee, R. Vora, A. F. Yorinks, G. Newsome, P. Bhattacharjya, D. Doherty, John Ellson, C. Hunt, Antonio Rodriguez-Moral, N. V. Srinivasan, W. Kraeft, J. Ippolito
IEEE J. Sel. Areas Commun.8
1991 Massively parallel algorithms for scattering in optical lithography
abstract
A novel massively parallel technique for rigorous simulation of topography scattering in optical lithography has been developed and tested. The method is equivalent to the time-domain finite-difference method (TDFDM) used in electromagnetic scattering simulations, but exploits the parallel nature of wave propagation and the power of recent massively parallel architectures such as the Connection Machine. A working code called TEMPEST has been implemented on a Connection Machine CM-2 having 1 to 32 K processors with up to 1 M virtual processors. Numerical accuracy comparable with that of other fully rigorous methods was achieved. A very significant finding was that the solution required constant time per iteration for problems ranging from a few thousand unknowns up to one million, provided the ratio between the problem size and the number of processors is kept constant. The suitability of TEMPEST for solving a large class of topography structures important in alignment, metrology, and lithography is illustrated by examples.>
Roberto Guerrieri, Karim H. Tadros, John K. Gamelin, Andrew R. Neureuther
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.3