Berton D. Epler

dblp:00/5459 · DBLP profile ↗
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2ranked-venue papers
0as first author
0since 2021 · last 1991
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 62% Performance modeling and evaluation · 11% Integrated circuit design · 11%

Topics — the 6 heaviest of 6, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
circuit simulation
0.021991
Direct circuit simulation algorithms for parallel processing [VLSI] · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991
Transient Sensitivity Computation for MOSFET Circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1985
Electronic design automation › circuit simulation
parallel circuit simulation
0.011991
Direct circuit simulation algorithms for parallel processing [VLSI] · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991
Integrated circuit design
analog and mixed-signal circuits
0.011985
Transient Sensitivity Computation for MOSFET Circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1985
Performance modeling and evaluation › statistical analysis › sensitivity analysis
transient sensitivity analysis
0.011985
Transient Sensitivity Computation for MOSFET Circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1985
High-performance computing
parallel numerical algorithms
0.011991
Direct circuit simulation algorithms for parallel processing [VLSI] · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991
Parallel and multicore computing
parallel programming models
0.011991
Direct circuit simulation algorithms for parallel processing [VLSI] · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991

Methods — techniques the papers use, named apart from their topics

sparse matrix factorization · 0.0direct method · 0.0direct sensitivity analysis · 0.0adjoint sensitivity analysis · 0.0
YearPublicationVenuePosition
1991 Direct circuit simulation algorithms for parallel processing [VLSI]
abstract
The improvement in computational throughput of VLSI circuit simulation is addressed. A high degree of natural parallelism exists in the circuit simulation problem; potentially a large number of processor can be used efficiently. Three distinct approaches for obtaining parallel execution in direct-method circuit simulators are investigated. These approaches differ primarily in the size of the individual tasks used to obtain parallel execution. The relative advantages of each approach are examined, and performance data from simulations on parallel processing systems are presented. For the third approach, very good parallel efficiency was obtained; in some cases, 99% parallelism has been observed.>
Paul F. Cox, Richard Burch, Dale E. Hocevar, Ping Yang 0001, Berton D. Epler
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.5
1985 Transient Sensitivity Computation for MOSFET Circuits
abstract
This paper discusses the algorithms and implementation necessary for computing time domain sensitivities during circuit simulation. The adjoint approach and the direct approach have been studied, and it was concluded that the direct approach is the best for implementation. The direct approach allows the transient sensitivities to be computed concurrently in time with the normal simulation, and it has been demonstrated that accurate sensitivity computations can be obtained, by simply allowing the sensitivity circuits to use the same time steps as the original circuit. This implementation also incorporates the charge based model for the MOSFET's and those sensitivity derivations are shown. It has been found that the responses of the sensitivity circuits can be discontinuous, and that this is due to discontinuities in the derivatives of the charge with respect to voltage. Derivations for various performance function sensitivities in terms of the response sensitivities are also given.
Dale E. Hocevar, Ping Yang 0001, Timothy N. Trick, Berton D. Epler
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.4