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Ravi Apte

dblp:01/4194 · DBLP profile ↗
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3ranked-venue papers
0as first author
0since 2021 · last 2008
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 95% Integrated circuit design · 5%

Topics — the 6 heaviest of 6, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.011985
A unified approach to simulation and timing verification at the functional level · DAC 1985
Electronic design automation › hardware verification and test
logic simulation
0.011985
A unified approach to simulation and timing verification at the functional level · DAC 1985
Electronic design automation › hardware verification and test
timing verification
0.011985
A unified approach to simulation and timing verification at the functional level · DAC 1985
Electronic design automation › hardware verification and test › hardware verification
consistency checking
0.011983
Consistency checking for MOS/VLSI circuits · DAC 1983
Electronic design automation › hardware verification and test
hardware verification
0.011983
Consistency checking for MOS/VLSI circuits · DAC 1983
Integrated circuit design › VLSI design
MOS VLSI circuits
0.011983
Consistency checking for MOS/VLSI circuits · DAC 1983

Methods — techniques the papers use, named apart from their topics

mixed-mode simulation · 0.0consistency checking · 0.0
YearPublicationVenuePosition
2008 Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the IEEE 1500 Standard
abstract
This paper describes a core-based test and diagnosis integration and automation system, called Turbo1500, which automatically synthesizes test and diagnosis logic in accordance with the IEEE 1500 standard. Turbo1500 serves two major purposes. One is for use as a core test automation tool in a system-on-chip (SOC) environment to automatically connect multiple cores from various sources and create testbenches each targeting an individual core under the control of a chip-level test access port (TAP) controller. The other is for hierarchical (block-by-block) core test and diagnosis when chips on a printed-circuit board are embedded with 1149.1 boundary scan I/O cells and cores under test and diagnosis are surrounded with 1500-compliant wrapper cells. Application experience showed that the simplicity of the IEEE 1500 standard combined with an easy-to-use automation tool can make core-based design for test and diagnosis no longer a nightmare, especially when some cores are extremely large or complex.
Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Kuen-Jong Lee, Xiaoqing Wen, Wen-Ben Jone, Chia-Hsien Yeh, Wei-Shin Wang, Hao-Jan Chao, Jianghao Guo, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang
ITC2
1985 A unified approach to simulation and timing verification at the functional level
abstract
This paper describes an integrated pair of tools - one designed for Timing Verification and the other designed for Logic Simulation - in a multi-level, mixed mode description environment.
Vighneswara Row Mokkarala, Antony Fan, Ravi Apte
DAC3
1983 Consistency checking for MOS/VLSI circuits
Ning-Sang Chang, Ravi Apte
DAC2