EDBT 2026 Demo / reviewers in the wild / expert
Jung-Sik Kim
dblp:02/10250
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 2016
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1Software engineering, systems software and programming languages · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 33% Memory systems · 26% Integrated circuit design · 26% |
Topics — the 5 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Memory systems
3d-stacked memory |
0.2 | 1 | 2013 | Quantifying the relationship between the power delivery network and architectural policies in a 3D-stacked memory device · MICRO 2013 |
Electronic design automation › power integrity
IR-drop |
0.2 | 1 | 2013 | Quantifying the relationship between the power delivery network and architectural policies in a 3D-stacked memory device · MICRO 2013 |
Integrated circuit design
power delivery network |
0.2 | 1 | 2013 | Quantifying the relationship between the power delivery network and architectural policies in a 3D-stacked memory device · MICRO 2013 |
Energy-efficient computing
power management |
0.0 | 1 | 2013 | Quantifying the relationship between the power delivery network and architectural policies in a 3D-stacked memory device · MICRO 2013 |
Electronic design automation › power integrity
voltage fluctuation |
0.0 | 1 | 2013 | Quantifying the relationship between the power delivery network and architectural policies in a 3D-stacked memory device · MICRO 2013 |
Methods — techniques the papers use, named apart from their topics
pin count modeling · 0.2IR-drop analysis · 0.2
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2016 | Addressing service interruptions in memory with thread-to-rank assignmentabstractIn future memory systems, some regions of memory will be periodically unavailable to the processor. In DRAM systems, this may happen because a rank is busy performing refresh. In non-volatile memory systems, this may happen because a rank is busy draining long-latency writes. Unfortunately, such service interruptions can introduce stalls in all running threads. This is because the operating system spreads the pages of a thread across all memory ranks. Therefore, the probability of a thread accessing data in an unavailable rank is high. This is a performance artifact that has previously not been carefully analyzed. To reduce these stalls, we propose a simple page coloring mechanism that tries to minimize the number of ranks over which a thread's pages are spread. This approach ensures that a service interruption in a single rank only stalls a subset of threads; non-stalled threads even have the potential to run faster at this time because of reduced bus contention. Our analysis shows that this approach is more effective than recent hardware-based mechanisms to deal with such service interruptions. For example, when dealing with service interruptions because of DRAM refresh, the proposed page coloring approach yields an execution time that is 15% lower than the best competing hardware approach. Manjunath Shevgoor, Rajeev Balasubramonian, Niladrish Chatterjee, Jung-Sik Kim |
ISPASS | 4 |
| 2013 | Quantifying the relationship between the power delivery network and architectural policies in a 3D-stacked memory deviceabstractMany of the pins on a modern chip are used for power delivery. If fewer pins were used to supply the same current, the wires and pins used for power delivery would have to carry larger currents over longer distances. This results in an "IR-drop" problem, where some of the voltage is dropped across the long resistive wires making up the power delivery network, and the eventual circuits experience fluctuations in their supplied voltage. The same problem also manifests if the pin count is the same, but the current draw is higher. IR-drop can be especially problematic in 3D DRAM devices because (i) low cost (few pins and TSVs) is a high priority, (ii) 3D-stacking increases current draw within the package without providing proportionate room for more pins, and (iii) TSVs add to the resistance of the power delivery network. Manjunath Shevgoor, Jung-Sik Kim, Niladrish Chatterjee, Rajeev Balasubramonian, Al Davis, Aniruddha N. Udipi |
MICRO | 2 |