There is a growing need to reduce device power to meet environmental, thermal, packaging, operating cost and other constraints in enterprise and carrier class applications. These pressures affect all levels of design targeted towards non-mobile applications: in the data center and its cloud, in the corporate enterprise - storage and WAN, in servers and embedded processing platforms, and in telecom wired transport and wireless backhaul networks.

Test-pattern generation for high fault coverage is an expensive and time-consuming process. As an alternative circuits can be tested by applying random or pseudorandom patterns. To analyze random testing without fault simulation, the number of vectors that detect a fault in each fault class must be enumerated. A fault-detection function whose number of minterms is identical to the fault detectability is constructed. Extensions are made to the Cutting algorithm to evaluate the signal probability of the detection or its bounding functions. The signal probability can then be converted easily into an exact detectability or narrow detectability range associated with each fault.>