Given ever-increasing circuit complexities, recent trends are driving the requirement for distributed timing analysis (DTA) in electronic design automation (EDA) tools. However, DTA has received little research attention so far and remains a critical problem. In this paper, we introduce a DTA framework for large designs. Our framework supports (1) general design partitions in distributed file systems, (2) non-blocking IO with event-driven loop for effective communication and computation overlap, and (3) an efficient messaging interface between application and network layers. The effectiveness and scalability of our framework has been evaluated on large hierarchical industry designs over a cluster with hundreds of machines.

The increasing significance of variability in modern sub-micron manufacturing process has led to the development and use of statistical techniques for chip timing analysis and optimization. Statistical timing involves fundamental operations like statistical-add, sub, max and min to propagate timing information (modeled as random variables with known probability distributions) through a timing graph model of a chip design. Although incremental timing during optimization updates timing information of only certain parts of the timing-graph, lack of established reversible statistical max or min techniques forces more-than-required computations.

Statistical static timing analysis (SSTA) is ideal for random variations but is not suitable for environmental variations like Vdd and temperature. SSTA uses statistical approximation, according to which circuit timing is predicted accurately only for highly probable combinations of variational parameters. SSTA is not able to handle accurately deterministic sources of variation like supply voltage. This paper presents a novel technique for modeling nonseparable deterministic and statistical variations in single timing run.

Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult since different paths are frequency-limiting in different parts of the multi-dimensional process space. Therefore, it is desirable to have a new diagnostic metric for robust circuit optimization. This paper presents a novel algorithm to compute the criticality probability of every edge in the timing graph of a design with linear complexity in the circuit size. Using industrial benchmarks, we verify the correctness of our criticality computation via Monte Carlo simulation. We also show that for large industrial designs with 442,000 gates, our algorithm computes all edge criticalities in less than 160 seconds.

Variability in digital integrated circuits makes timing verification an extremely challenging task. In this paper, a canonical first-order delay model that takes into account both correlated and independent randomness is proposed. A novel linear-time block-based statistical timing algorithm is employed to propagate timing quantities like arrival times and required arrival times through the timing graph in this canonical form. At the end of the statistical timing, the sensitivity of all timing quantities to each of the sources of variation is available. Excessive sensitivities can then be targeted by manual or automatic optimization methods to improve the robustness of the design. This paper also reports the first incremental statistical timer in the literature, which is suitable for use in the inner loop of physical synthesis or other optimization programs. The third novel contribution of this paper is the computation of local and global criticality probabilities. For a very small cost in computer time, the probability of each edge or node of the timing graph being critical is computed. Numerical results are presented on industrial application-specified integrated circuit (ASIC) chips with over two million logic gates, and statistical timing results are compared to exhaustive corner analysis on a chip design whose hardware showed early mode timing violations

This paper approaches statistical optimization by examining gate delay variation models and optimization objectives. Most previous work on statistical optimization has focused exclusively on the optimization algorithms without considering the effects of the variation models and objective functions. This work empirically derives a simple variation model that is then used to optimize for robustness. Optimal results from example circuits used to study the effect of the statistical objective function on parametric yield.

As technology scales into the sub-90 nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as statistical distributions during both analysis and optimization. This paper uses incremental, parametric statistical static timing analysis (SSTA) to perform gate sizing with a required yield target. Both correlated and uncorrelated process parameters are considered by using a first-order linear delay model with fitted process sensitivities. The fitted sensitivities are verified to be accurate with circuit simulations. Statistical information in the form of criticality probabilities are used to actively guide the optimization process which reduces run-time and improves area and performance. The gate sizing results show a significant improvement in worst slack at 99.86% yield over deterministic optimization.

High post-placement congestion in complex ASICs and microprocessors may pose severe constraints on the wiring resources, thereby causing wireability, timing and noise problems. Linear wirelength-based mincut partitioning algorithms have some built-in advantages for reducing congestion. We present a mathematical model of congestion and experimentally investigate various congestion mitigation techniques used in conjunction with linear wirelength-based placement. The experimental results validate our congestion model. Our placement tool, CPlace(C), is a clustering-based mincut partitioner that optimizes a linear wirelength objective.

In this paper we address the problem of placement of standard cells under the constraints of minimizing the clock-skew. We propose a quadratic programming based methodology for placement that not only results in an area and timing wise good placement but also a supporting zero-skew clock routing tree. Under the clock-skew constraints, our method produces significant reduction in the cost of zero-skew clock routing tree. During placement, we are able to obtain significant speed-up due to variable reduction and constraint modification.

In this paper we present a fast and computationally efficient deterministic method for estimating the area of a register transfer level datapath obtained during high level VLSI synthesis. The estimation makes use of a RT level netlist along with a pre-synthesized library of RT level components. The layout area is estimated using a quadratic programming based framework to get a quick module allocation and generating a topological floorplan which is then followed by heuristic algorithms for mapping RTL modules and their interconnections on a standard cell based layout design style. Experiments on a suite of benchmark examples show promising results with reliable accuracy.