Using optical triangulation methods to measure the shape of translucent objects is difficult because subsurface scattering contaminates measurements of the “direct” reflection at the surface. A number of recent papers have shown that high-frequency sinusoidal illumination patterns allow isolating this direct component, which in turn enables accurate estimation of the shape of translucent objects. Despite these encouraging results, there is currently no rigorous mathematical analysis of the expected error in the measured surface as it relates to the parameters of these systems: the frequency of the projected sinusoid, the geometric configuration of the source and camera, and the optical properties of the target object. We present such an analysis, which confirms earlier empirical results and provides a much needed tool for designing 3D scanners for translucent objects.

We present a method for automatically converting a digital 3D model into a multilayer model : a parallel stack of high-resolution 2D images embedded within a semi-transparent medium. Multilayer models can be produced quickly and cheaply and provide a strong sense of an object's 3D shape and texture over a wide range of viewing directions. Our method is designed to minimize visible cracks and other artifacts that can arise when projecting an input model onto a small number of parallel planes, and avoid layer transitions that cut the model along important surface features. We demonstrate multilayer models fabricated with glass and acrylic tiles using commercially available printers.

We present a novel optical setup and processing pipeline for measuring the 3D geometry and spatially-varying surface reflectance of physical objects. Central to our design is a digital camera and a high frequency spatially-modulated light source aligned to share a common focal point and optical axis. Pairs of such devices allow capturing a sequence of images from which precise measurements of geometry and reflectance can be recovered. Our approach is enabled by two technical contributions: a new active multiview stereo algorithm and an analysis of light descattering that has important implications for image-based reflectometry. We show that the geometry measured by our scanner is accurate to within 50 microns at a resolution of roughly 200 microns and that the reflectance agrees with reference data to within 5.5%. Additionally, we present an image relighting application and show renderings that agree very well with reference images at light and view positions far from those that were initially measured.

This paper presents a technique for acquiring the shape of real-world objects with complex isotropic and anisotropic reflectance. Our method estimates the local normal and tangent vectors at each pixel in a reference view from a sequence of images taken under varying point lighting. We show that for many real-world materials and a restricted set of light positions, the 2D slice of the BRDF obtained by fixing the local view direction is symmetric under reflections of the halfway vector across the normal-tangent and normal-binormal planes. Based on this analysis, we develop an optimization that estimates the local surface frame by identifying these planes of symmetry in the measured BRDF. As with other photometric methods, a key benefit of our approach is that the input is easy to acquire and is less sensitive to calibration errors than stereo or multi-view techniques. Unlike prior work, our approach allows estimating the surface tangent in the case of anisotropic reflectance. We confirm the accuracy and reliability of our approach with analytic and measured data, present several normal and tangent fields acquired with our technique, and demonstrate applications to appearance editing.