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John K. Hagge

dblp:06/3204 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1992
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 87% Integrated circuit design · 13%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.011992
High-yield assembly of multichip modules through known-good IC's and effective test strategies · Proc. IEEE 1992
Electronic design automation
manufacturing yield
0.011992
High-yield assembly of multichip modules through known-good IC's and effective test strategies · Proc. IEEE 1992
Integrated circuit design › packaging
multichip module
0.011992
High-yield assembly of multichip modules through known-good IC's and effective test strategies · Proc. IEEE 1992

Methods — techniques the papers use, named apart from their topics

test strategy design · 0.0known-good IC testing · 0.0
YearPublicationVenuePosition
1992 High-yield assembly of multichip modules through known-good IC's and effective test strategies
abstract
Multichip module technology has been shown to offer significant improvements for electronics equipment in the areas of miniaturized size, reduced weight, capability for higher frequency operation, improved thermal performance, and improved reliability. Production applications for multichip modules (MCMs) have grown from high-end computer and aerospace modules to include such diverse products as telecommunications, automotive, and consumer electronics modules. One of the keys to economic success in all applications is the achievement of high manufacturing yields. Yield losses must be kept very low compared with module costs in order to remain economically competitive. Two parameters with a very strong impact on manufacturing yield, known-good components entering assembly and test strategies at various levels of assembly, are discussed. Current industry practice is surveyed and recent progress on MCM infrastructure development is summarized.>
John K. Hagge, Russell J. Wagner
Proc. IEEE1