This paper presents HotSpot-a modeling methodology for developing compact thermal models based on the popular stacked-layer packaging scheme in modern very large-scale integration systems. In addition to modeling silicon and packaging layers, HotSpot includes a high-level on-chip interconnect self-heating power and thermal model such that the thermal impacts on interconnects can also be considered during early design stages. The HotSpot compact thermal modeling approach is especially well suited for preregister transfer level (RTL) and presynthesis thermal analysis and is able to provide detailed static and transient temperature information across the die and the package, as it is also computationally efficient.

FPGA logic densities continue to increase at a tremendous rate. This has had the undesired consequence of increased power density, which manifests itself as higher on-die temperatures and local hotspots. Sophisticated packaging techniques have become essential to maintain the health of the chip. In addition to static techniques to reduce the temperature, dynamic thermal management techniques are essential. Such techniques rely on accurate on-chip temperature information. In this paper, we present the design of a system that monitors the temperatures at various locations on the FPGA. This system is composed of a controller interfacing to an array of temperature sensors that are implemented on the FPGA fabric. Such a system can be used to implement dynamic thermal management techniques. We cross validate the sensor readings with values obtained from HotSpot, a pre-RTL architectural level thermal modeling tool.

Thermal design in sub-100nm technologies is one of the major challenges to the CAD community. In this paper, we first introduce the idea of temperature-aware design. We then propose a compact thermal model which can be integrated with modern CAD tools to achieve a temperature-aware design methodology. Finally, we use the compact thermal model in a case study of microprocessor design to show the importance of using temperature as a guideline for the design. Results from our thermal model show that a temperature-aware design approach can provide more accurate estimations, and therefore better decisions and faster design convergence.

With cooling costs rising exponentially, designing cooling solutions for worst-case power dissipation is prohibitively expensive. Chips that can autonomously modify their execution and power-dissipation characteristics permit the use of lower-cost cooling solutions while still guaranteeing safe temperature regulation. Evaluating techniques for thisdynamic thermal management(DTM), however, requires a thermal model that is practical for architectural studies.This paper describesHotSpot, an accurate yet fast and practical model based on an equivalent circuit of thermal resistances and capacitances that correspond to microarchitecture blocks and essential aspects of the thermal package. Validation was performed using finite-element simulation. The paper also introduces several effective methods for DTM: "temperature-tracking" frequency scaling, "migrating computation" to spare hardware units, and a "hybrid" policy that combines fetch gating with dynamic voltage scaling. The latter two achieve their performance advantage by exploiting instruction-level parallelism, showing the importance of microarchitecture research in helping control the growth of cooling costs.Modeling temperature at the microarchitecture level also shows that power metrics are poor predictors of temperature, that sensor imprecision has a substantial impact on the performance of DTM, and that the inclusion of lateral resistances for thermal diffusion is important for accuracy.

With power density and hence cooling costs rising exponentially, processor packaging can no longer be designed for the worst case, and there is an urgent need for runtime processor-level techniques that can regulate operating temperature when the package's capacity is exceeded. Evaluating such techniques, however, requires a thermal model that is practical for architectural studies.This paper describes HotSpot, an accurate yet fast model based on an equivalent circuit of thermal resistances and capacitances that correspond to microarchitecture blocks and essential aspects of the thermal package. Validation was performed using finite-element simulation. The paper also introduces several effective methods for dynamic thermal management (DTM): "temperature-tracking" frequency scaling, localized toggling, and migrating computation to spare hardware units. Modeling temperature at the microarchitecture level also shows that power metrics are poor predictors of temperature, and that sensor imprecision has a substantial impact on the performance of DTM.