Demo Data from EDBT 2026 / reviewers in the wild / expert
R. E. Burke
dblp:06/4846
· DBLP profile ↗
2ranked-venue papers
2as first author
0since 2021 · last 1965
—ORCID · unresolved
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 100% | |
| Theoretical computer science
1 paper |
Information theory · 100% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design
digital circuit design |
0.0 | 1 | 1965 | NAND-AND Circuits · IEEE Trans. Electron. Comput. 1965 |
Integrated circuit design › digital circuit design › threshold logic
threshold logic circuits |
0.0 | 1 | 1965 | NAND-AND Circuits · IEEE Trans. Electron. Comput. 1965 |
Information theory
pattern recognition |
0.0 | 1 | 1965 | NAND-AND Circuits · IEEE Trans. Electron. Comput. 1965 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1965 | Correction [to "Some techniques of state assignment for synchronous sequential machines"]abstractR.M. Karp, author of "Some Techniques of State Assignment for Synchronous Sequential Machines," which appeared on pages 507-518 of the October, 1964, issue of these Transactions, notes corrections on page 511, column 1, line 36, and on page 517, "(2a)-(2d)" should be replaced by "a, b, c, and d" in the following places: column 1, 5 lines from the bottom, column 2, lines 1-2, line 25, and line 28. R. E. Burke, J. G. Van Bosse |
IEEE Trans. Electron. Comput. | 1 |
| 1965 | NAND-AND CircuitsabstractThreshold functions and statistical recognition have been the subjects of many papers and, although the threshold functions have frequently been used as a logic implementation in empirical studies of pattern recognition [1], most, if not all, of the reported theoretical investigations treat these two subjects separately. The purpose of this paper is to present an equivalence between threshold functions and statistical recognition with independent distributions. R. E. Burke, J. G. Van Bosse |
IEEE Trans. Electron. Comput. | 1 |