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Keren Zohar

dblp:07/2522 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2006
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
coverage analysis
0.112006
Advanced Analysis Techniques for Cross-Product Coverage · IEEE Trans. Computers 2006
Electronic design automation › hardware verification and test
functional verification
0.112006
Advanced Analysis Techniques for Cross-Product Coverage · IEEE Trans. Computers 2006
Electronic design automation › hardware verification and test
hardware verification
0.112006
Advanced Analysis Techniques for Cross-Product Coverage · IEEE Trans. Computers 2006
Electronic design automation
hardware verification and test
0.012006
Advanced Analysis Techniques for Cross-Product Coverage · IEEE Trans. Computers 2006

Methods — techniques the papers use, named apart from their topics

interactive visualization · 0.1coverage model analysis · 0.1
YearPublicationVenuePosition
2006 Advanced Analysis Techniques for Cross-Product Coverage
abstract
Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools' help users identify areas in the design that have not been adequately tested. Because of their sheer size, the analysis of large coverage models can be an intimidating and time-consuming task. This paper presents several techniques for coverage analysis. These techniques range from highly interactive and dynamic analysis that allows users to focus on certain aspects or areas of interest in the coverage model to fully automated coverage analysis, which identifies uncovered or lightly covered areas. The proposed techniques provide additional means for extracting relevant, useful information, thereby improving the quality of the coverage analysis. A number of examples show how the proposed method improved the verification of actual designs
Hezi Azatchi, Laurent Fournier, Eitan Marcus, Shmuel Ur, Avi Ziv, Keren Zohar
IEEE Trans. Computers6