Demo Data from EDBT 2026 / reviewers in the wild / expert
Hui-Yuan Song
dblp:07/3185
· DBLP profile ↗
4ranked-venue papers
2as first author
0since 2021 · last 2006
0009-0005-6220-8573ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 63% Integrated circuit design · 20% Performance modeling and evaluation · 17% |
Topics — the 5 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Performance modeling and evaluation
delay analysis |
0.1 | 1 | 2006 | Timing analysis for full-custom circuits using symbolic DC formulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2006 |
Electronic design automation › timing analysis › static timing analysis
symbolic timing analysis |
0.1 | 1 | 2006 | Timing analysis for full-custom circuits using symbolic DC formulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2006 |
Electronic design automation
timing analysis |
0.1 | 1 | 2006 | Timing analysis for full-custom circuits using symbolic DC formulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2006 |
Integrated circuit design
charge sharing |
0.1 | 1 | 2005 | Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2005 |
Electronic design automation
hardware verification and test |
0.1 | 1 | 2005 | Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2005 |
Methods — techniques the papers use, named apart from their topics
algebraic decision diagrams · 0.1symbolic matrix technique · 0.1symbolic analysis · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2006 | Timing analysis for full-custom circuits using symbolic DC formulationsabstractSuccessful analysis of high-speed integrated circuits requires accurate delay computation. A number of delay models have been developed; however, none can claim to be truly robust in the face of large channel-connected regions (CCRs) with input "exclusivity" constraints. A good circuit-level delay model should: 1) consider input exclusivity constraints; 2) handle a wide range of circuit structures; and 3) have a robust underlying framework that can be applied independent of the actual device model. We present a symbolic timing analysis tool that aims to address these three goals. It uses algebraic decision diagrams (ADDs) to estimate delay within a CCR as a function of its inputs while easily handling Boolean input constraints. It starts with a simple linear resistor model for transistors and from there apply various heuristics to improve the delay estimation without altering the symbolic algorithms. It analyzes delay with simple series-parallel reduction when possible and use symbolic matrix techniques to handle more complex circuit structures. The effectiveness of our approach is demonstrated on circuits from industry used in the Alpha 21264 and 21364 instead of the usual International Symposium on Circuits and Systems (ISCAS) or Microelectronics Center of North Carolina (MCNC) benchmarks. Our delay estimates are within 10% of simulation program with integrated circuits emphasis (SPICE) for over 90% of the circuits we simulated. This difference can translate into significant savings in manpower by avoiding the need to verify many unrealizable worst case conditions with other, more costly, simulation techniques Hui-Yuan Song, Kundan Nepal, R. Iris Bahar, Joel Grodstein |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 2005 | Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharingabstractAs process geometries shrink, leakage currents and charge sharing are becoming increasingly critical problems, especially in full-custom circuit designs. Excessive leakage or charge sharing may cause functional failure at some or all operating conditions. Traditional circuit-analysis techniques may be used to verify if leakage currents are within allowable limits so as not to cause functional failures; however, unless the analysis takes into account specific input constraints for the circuit, the results may be overly pessimistic. Similar limitations exist for charge sharing. In this paper, we approach this verification problem symbolically using algebraic decision diagrams (ADDs). Using ADDs allows us to efficiently analyze leakage and charge sharing within a channel-connected region (CCR) as a function of its inputs. Exclusivity constraints are easily included in the analysis, thus allowing for more accurate (and less pessimistic) results. Our approach is general and can be applied to any arbitrary circuit structure, including a mesh. The effectiveness of our approach is demonstrated on circuits from industry used in the Alpha 21264 and 21364 instead of the usual international symposium on circuits and systems or Microelectronics Center of North Carolina benchmarks. We show that such an analysis can lead to up to a 90% difference in worst-case voltage drop. This difference can translate into significant savings in manpower by avoiding the need to verify many unrealizable worst-case conditions with other, more costly, simulation techniques. R. Iris Bahar, Hui-Yuan Song, Kundan Nepal, Joel Grodstein |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 2004 | RESTA: a robust and extendable symbolic timing analysis toolabstractSuccessful timing analysis for high-speed integrated circuits requires accurate delay computation. However, full-custom circuits popular in today's CPU designs make this difficult. A good circuit-level static timing analysis tool should 1) consider both internally or externally specified input constraints; 2) handle a wide range of circuit structures; and 3) have a robust underlying framework that can be applied independent of the actual device model. In this paper, we present RESTA, a Robust and Extendable Symbolic Timing Analysis tool that aims to address these three goals. RESTA estimates the delay for all valid input assignments, while naturally handling input constraints. We start with a simple linear resistor model for transistors and from there apply various heuristics to improve the delay estimation for the circuits without altering the symbolic algorithms. Our worst-case delay estimates are within 10% of SPICE for over 90% of the circuits we simulated. Kundan Nepal, Hui-Yuan Song, R. Iris Bahar, Joel Grodstein |
ACM Great Lakes Symposium on VLSI | 2 |
| 2003 | Symbolic Failure Analysis of Custom Circuits due to Excessive Leakage CurrentabstractAs process geometries shrink, leakage current is becoming an increasingly critical problem, especially in full-custom circuit designs. Excessive leakage may cause functional failure at some or all operating conditions. Traditional circuit analysis techniques may be used to verify if leakage currents are within allowable limits so as not to cause functional failures; however, unless the analysis takes into account specific input constraints for the circuit, the results may be overly pessimistic. We approach this noise analysis problem symbolically using algebraic decision diagrams (ADDs). Using ADDs allows us to efficiently analyze leakage within a channel-connected region (CCR) as a function of its inputs. Exclusivity constraints are easily included in the analysis, thus allowing for more accurate (and less pessimistic) results. Our approach is general and can be applied to any arbitrary circuit structure, including a mesh. The effectiveness of our approach is demonstrated on circuits from industry used in Alpha 21264 and 21364 instead of the usual ISCAS benchmarks. We show that such an analysis can lead to up to a 90% difference in worst case voltage drop. This difference can translate into significant savings in manpower by avoiding the need to verify many unrealizable worst-case conditions with other, more costly, simulation techniques. Hui-Yuan Song, S. Bohidar, R. Iris Bahar, Joel Grodstein |
ICCD | 1 |