Demo Data from EDBT 2026 / reviewers in the wild / expert
Tatsurou Miyoshi
dblp:09/5589
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1989
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 87% Integrated circuit design · 13% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › technology computer-aided design
process simulation |
0.0 | 1 | 1989 | A general-purpose two-dimensional process simulator-OPUS for arbitrary structures · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989 |
Electronic design automation › technology computer-aided design › process simulation
two-dimensional process simulation |
0.0 | 1 | 1989 | A general-purpose two-dimensional process simulator-OPUS for arbitrary structures · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989 |
Integrated circuit design
semiconductor process modeling |
0.0 | 1 | 1989 | A general-purpose two-dimensional process simulator-OPUS for arbitrary structures · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989 |
Methods — techniques the papers use, named apart from their topics
finite difference method · 0.0discretization · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1989 | A general-purpose two-dimensional process simulator-OPUS for arbitrary structuresabstractA general-purpose two-dimensional process simulator OPUS (Oki Process simulator for ULSI Structures) for arbitrary structures is discussed. By separating a preprocessor from a main processor, OPUS can simulate any kind of impurity or material with up to eight impurities and ten materials. OPUS utilizes a finite-difference method for diffusion analysis without any coordinate transformation. In order to minimize errors due to discretization around the curved boundaries, OPUS has introduced two kinds of boundaries. The first is true boundaries by strings. The other is quasi-boundaries formed through simplifying but retaining the shape of true boundaries as long as possible. The quasi-boundaries and resulting dummy cells are used for discretization of the diffusion equation. General features of OPUS are first introduced with special emphasis on dummy cells. Errors caused by dummy cells are discussed. The capacity of OPUS is then demonstrated through application to a trench process and to a full MOS process with a sidewall.> Kenji Nishi, Kouichi Sakamoto, Shigeki Kuroda, Jun Ueda, Tatsurou Miyoshi, Shintaro Ushio |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 5 |