Advances in very large-scale integration technology make clock skew more susceptible to process variations. Notwithstanding efficient exact zero-skew algorithms, clock skew still limits post-manufacturing performance. Process-induced skew presents an ever-growing limitation for high-speed large-area clock networks. To achieve multigigahertz operation for high-end designs, clock networks must be constructed to tolerate variations in various interconnect parameters. This paper proposes a statistical centering-based clock routing algorithm that is built upon deferred merging embedding that greatly improves skew tolerance to interconnect variations. The algorithm achieves the improvement by the following ways: (1) choosing the best center measure which is dynamically based on the first three moments of the skew distribution and (2) designing for all sink pairs in the subtrees simultaneously. In addition, a variation-aware abstract topology generation algorithm is proposed in this paper. Experiments on benchmark circuits demonstrate that the proposed method reduces the number of skew violations by 12%-37%.

Advances in VLSI technology make clock skew more susceptible to process variations. Notwithstanding efficient zero skew routing algorithms, clock skew still limits post-manufacturing performance. Process-induced skew presents an ever-growing limitation for high speed, large area clock networks. To achieve multi-GHz operation for high-end designs, clock networks must be constructed to tolerate variations in various interconnect parameters. We propose statistical centering based clock routing algorithm built upon DME that greatly improves skew tolerance to interconnect variations. The algorithm achieves the improvement by: i) choosing the best center measure which is dynamically based on the first three moments of the skew distribution, and ii) designing for all sink pairs in the subtrees simultaneously. In addition, a variation aware abstract topology generation algorithm is proposed in this paper. Experiments on benchmark circuits demonstrate the efficiency of the proposed method in reducing the number of skew violations by 12%-37%.

New nanotechnology based devices are replacing CMOS devices to overcome CMOS technology's scaling limitations. However, many such devices exhibit nonmonotonic I-V characteristics and uncertain properties which lead to the negative differential resistance (NDR) problem and the chaotic performance. This paper proposes a new circuit simulation approach that can effectively simulate nanotechnology devices with uncertain input sources and negative differential resistance (NDR) problem. The experimental results show a 20-30 times speedup comparing with existing simulators.