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E. Profumo

dblp:10/5938 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1986
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 87% Integrated circuit design · 13%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
circuit simulation		 0.011986
A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1986
Electronic design automation › circuit simulation
transient analysis		 0.011986
A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1986
Integrated circuit design
charge conservation		 0.011986
A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1986

Methods — techniques the papers use, named apart from their topics

ward's model · 0.0numerical integration · 0.0meyer's model · 0.0
YearPublicationVenuePosition
1986 A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's
abstract
It is well known that Meyer's model for the MOST implemented in SPICE does not guarantee charge conservation, while Ward's model seems somewhat complex to be used as a standard for the transient analysis of all the MOS circuits. In this work, a new simple MOST model for the transient analysis of MOS integrated circuits is presented. The model was developed by performing the numerical integration of the gate current as a first step without introducing the concept of a mean constant capacitance. The new model has been implemented in the program SGS-SPICE. All benchmark tests indicate that it conserves the charge at all the terminals of the MOS transistor.
Claudio Turchetti, P. Prioretti, Guido Masetti, E. Profumo, Massimo Vanzi
 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.4