Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Wendell H. Lunceford

dblp:11/326 · DBLP profile ↗
← Back
1ranked-venue papers
0as first author
0since 2021 · last 1995
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Performance modeling and evaluation · 100%

Topics — the 1 heaviest of 1, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Performance modeling and evaluation › simulation › parallel and distributed simulation › distributed simulation
distributed interactive simulation
0.011995
Application of distributed interactive simulation technology within the Department of Defense · Proc. IEEE 1995

Methods — techniques the papers use, named apart from their topics

simulation · 0.0
YearPublicationVenuePosition
1995 Application of distributed interactive simulation technology within the Department of Defense
abstract
The paper focuses on distributed interactive simulation (DIS) as an emerging technology which offers new opportunities for the Department of Defense in the design of simulation systems, the approach to training, and the improvement of the material acquisition process. Discussion of these topics is followed by an overview of selected Department of Defense programs that employ DIS. The paper concludes with a brief discussion of technology challenges that must be overcome for this technology to reach its full potential.>
James E. Shiflett, Wendell H. Lunceford, Ruth Willis
Proc. IEEE2