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Harmander Singh

dblp:11/584 · also Harmander Deogun, Harmander Singh Deogun · DBLP profile ↗
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7ranked-venue papers
5as first author
0since 2021 · last 2010
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 7 · 5 first-authorSoftware engineering, systems software and programming languages · 1Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 46% Electronic design automation · 46% Energy-efficient computing · 7%

Topics — the 5 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › low-power circuit design
bus encoding
0.012004
Leakage-and crosstalk-aware bus encoding for total power reduction · DAC 2004
Electronic design automation › signal integrity
crosstalk mitigation
0.012004
Leakage-and crosstalk-aware bus encoding for total power reduction · DAC 2004
Electronic design automation
interconnect modeling
0.012004
Leakage-and crosstalk-aware bus encoding for total power reduction · DAC 2004
Integrated circuit design
low-power circuit design
0.012004
Leakage-and crosstalk-aware bus encoding for total power reduction · DAC 2004
Energy-efficient computing
leakage power reduction
0.012004
Leakage-and crosstalk-aware bus encoding for total power reduction · DAC 2004

Methods — techniques the papers use, named apart from their topics

high threshold voltage buffer design · 0.0bus encoding · 0.0
YearPublicationVenuePosition
2010 Dynamically Pulsed MTCMOS With Bus Encoding for Reduction of Total Power and Crosstalk Noise
abstract
Increased buffer insertion along on-chip global lines and growing amounts of leakage power have resulted in buffer-based leakage emerging as one of the chief contributors to system leakage power. In this paper, a bus system prototype is implemented in an industrial 65-nm SOI technology and measured results show up to a 45% reduction in total bus system power and an average reduction of 2.4× in standby mode leakage power.
Harmander Singh, Rahul M. Rao, Kanak Agarwal 0001, Dennis Sylvester, Richard B. Brown
IEEE Trans. Very Large Scale Integr. Syst.1
2007 Enhanced Leakage Reduction Techniques Using Intermediate Strength Power Gating
abstract
The exponential increase in leakage power due to technology scaling has made power gating an attractive design choice for low-power applications. In this paper, we explore this design style in large combinational circuit blocks and latch-to-latch datapaths and introduce a novel power gating approach to yield an improved power-performance tradeoff. We first present a multiple sleep mode power gating technique where each mode represents a different point in the wake-up overhead versus leakage savings design space. We show that the high wake-up latency and wake-up power penalty of traditional power gating limits its application to large stretches of inactivity. The multiple-mode feature allows a processor to enter power saving modes more frequently, hence, resulting in enhanced leakage savings. We apply the multimode power gating technique to datapaths where the degree of applied power gating becomes progressively stronger (harder) along the datapath. This configuration allows us to further balance wake-up overhead with leakage savings by exploiting the fact that logic circuits deep in the datapath have higher wakeup margin and hence can be strongly gated. Simulations show that multiple sleep mode capability provides an extra 17% reduction in overall leakage compared to traditional single mode gating. The multiple modes can be designed to allow state-retentive modes. The results on benchmarks show that a single state-retentive mode can reduce leakage by 19% while preserving state of the circuit.
Harmander Singh, Kanak Agarwal 0001, Dennis Sylvester, Kevin J. Nowka
IEEE Trans. Very Large Scale Integr. Syst.1
2006 Fine grained multi-threshold CMOS for enhanced leakage reduction
abstract
The exponential increase in leakage power due to technology scaling has made multi-threshold CMOS (MTCMOS) an attractive design style for low-power applications. We explore this design style in a datapath and introduce a fine grained power gating approach to better exploit the power-performance tradeoff. We propose a power gating technique where the degree of power gating applied becomes progressively stronger further along the datapath
Harmander Singh, Dennis Sylvester, Kevin J. Nowka
ISCAS1
2006 A dual-VDD boosted pulsed bus technique for low power and low leakage operation
abstract
In this paper, we propose a new dual-VDD bus technique that is well suited for low power operation. This technique adapts a static pulsed bus architecture to use dual-VDD power supplies. During quiescent periods, the bus system idles at the lower of the two VDD supplies, thereby lowering static power dissipation. When actively transitioning, the inverters in the bus system are temporarily boosted to the higher VDD supply to provide the needed drive strength for performance. Since the VDD boosting is done in a pulsed manner, the bus system is in a high VDD state only when required, ensuring lower power operation without sacrificing performance. This technique yields up to a 50% reduction in total power over traditional static buses and up to a 35% reduction in total power over standard static pulsed buses, with a 12-15% delay improvement.
Harmander Singh, Robert M. Senger, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka
ISLPED1
2005 Bus encoding for total power reduction using a leakage-aware buffer configuration
abstract
Power consumption, particularly runtime leakage, in long on-chip buses has grown to be an unacceptable portion of the total power budget due to heavy buffer insertion used to combat RC delays. In this paper, we propose a new bus encoding algorithm and circuit scheme for on-chip buses that eliminates capacitive crosstalk while simultaneously reducing total power. We utilize a buffer design approach with a selective use of high-threshold voltage transistors and couple this buffer design with a novel bus encoding scheme. The proposed encoding scheme significantly reduces total power by 26% and runtime leakage power by 42% while also eliminating capacitive crosstalk. In addition, the proposed encoding is specifically optimized to reduce the complexity of the encoding logic, allowing for a significant reduction in overhead which has not been considered in previous bus encoding work.
Rajeev R. Rao, Harmander Singh, David T. Blaauw, Dennis Sylvester
IEEE Trans. Very Large Scale Integr. Syst.2
2004 Leakage-and crosstalk-aware bus encoding for total power reduction
abstract
Power consumption, particularly runtime leakage, in long on-chip buses has grown to an unacceptable portion of the total power budget due to heavy buffer insertion to combat RC delays. In this paper, we propose a new bus encoding algorithm and circuit scheme for on-chip buses that eliminates capacitive crosstalk while simultaneously reducing total power. We introduce a new buffer design approach with selective use of high threshold voltage transistors and couple this buffer design with a novel bus encoding scheme. The proposed encoding scheme significantly reduces total power by 26% and runtime leakage power by 42% while also eliminating capacitive crosstalk. In addition, the proposed encoding is specifically optimized to reduce the complexity of the encoding logic, allowing for a significant reduction in overhead which has not been considered in previous bus encoding work.
Harmander Singh, Rajeev R. Rao, Dennis Sylvester, David T. Blaauw
DAC1
2004 Simultaneous State, Vt and Tox Assignment for Total Standby Power Minimization
abstract
Standby leakage current minimization is a pressing concern for mobile applications that rely on standby modes to extend battery life. Also, gate oxide leakage current (I/sub gate/) has become comparable to subthreshold leakage (I/sub sub/) in 90 nm technologies. In this paper, we propose a new method that uses a combined approach of sleep-state, threshold voltage (V/sub t/ and gate oxide thickness (T/sub ox/) assignments in a dual-V/sub t/ and dual-T/sub ox/ process to minimize both I/sub sub/ and I/sub gate/. Using this method, total leakage current can be dramatically reduced since in a known state in standby mode, only certain transistors are responsible for leakage current and need to be considered for high-V/sub t/ or thick-T/sub ox/ assignment. We formulate the optimization problem for simultaneous state, V/sub t/ and T/sub ox/ assignments under delay constraints and propose two practical heuristics. We implemented and tested the proposed methods on a set of synthesized benchmark circuits. Results show an average leakage current reduction of 5a-6X and 2-3X compared to previous approaches that only use state or state+V/sub t/ assignment, respectively, with small delay penalties.
Harmander Singh, David T. Blaauw, Dennis Sylvester
DATE2