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Guy Anckaerts

dblp:116/6761 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2012
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
1 paper
Software testing · 100%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software testing
test reuse
0.112012
Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain · ICSE 2012
Software testing
test planning
0.012012
Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain · ICSE 2012

Methods — techniques the papers use, named apart from their topics

pattern-based knowledge repository · 0.1
YearPublicationVenuePosition
2012 Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain
abstract
While testing is heavily used and largely automated in software development projects, the reuse of test practices across similar projects in a given domain is seldom systematized and supported by adequate methods and tools. This paper presents a practical approach that emerged from a concrete industrial case in the smart card domain at STMicroelectronics Belgium in order to better address this kind of challenge. The central concept is a test knowledge repository organized as a collection of specific patterns named QPatterns. A systematic process was followed, first to gather, structure and abstract the test practices, then to produce and validate an initial repository, and finally to make it evolve later on Testers can then rely on this repository to produce high quality test plans identifying all the functional and nonfunctional aspects that have to be addressed, as well as the concrete tests that have to be developed within the context of a new project. A tool support was also developed and integrated in a traceable way into the existing industrial test environment. The approach was validated and is currently under deployment at STMicroelectronics Belgium.
Nicolas Devos, Christophe Ponsard, Jean-Christophe Deprez, Renaud Bauvin, Benedicte Moriau, Guy Anckaerts
ICSE6