EDBT 2026 Demo / reviewers in the wild / expert
Poornima Mittal
dblp:118/6995
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8ranked-venue papers
0as first author
8since 2021 · last 2026
0000-0002-9479-8628ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 8 · 8 since 2021
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2026 | A low-power half-select free 8T SRAM cell with process-induced variation resistance for voltage scaling at 32 nm technology node
Ayush Dahiya, Poornima Mittal, Rajesh Rohilla |
Integr. | 2 |
| 2025 | An 8T SRAM cell for high-speed sub-threshold operation with dynamic body biasing
Anshumat Dinesh, Yogita Chopra, Poornima Mittal |
Integr. | 3 |
| 2025 | A Variation Tolerant Write Assist Read Decoupled 9T SRAM Cell for Low Voltage ApplicationabstractDriven by the swift expansion of energy-demanding Internet of Things devices, on-chip SRAM is undergoing a significant evolution to attain reduced power usage. This shift ushers in a new era of self-sufficient and energy-efficient technology. This article proposes a novel 9-transistor Write Assist Read Decoupled (WARD) SRAM bitcell designed to achieve significant reductions in write latency. The design incorporates a low threshold (V TH ) write access transistor and leverages virtual ground (VGND) assist for low voltage operation at 32 nm CMOS technology node. It demonstrates notable improvements in write delay over conventional SRAM bitcells. At an operating voltage of 0.6 V, the WARD 9T cell offers reduced write “1” delay and write “0” delay by 3.18x/3.09x/2.42x/2.11x and 1.5x/1.475x/1.4x/1.37x/1.12x/1.118x compared to 9T half select free write assist (HFWA)/10T/9T single bitline (SB)/7T single-ended (SE) and 11T/9T HFWA/10T/9T transmission based read decoupled (TRD)/9T SB/7T SE cell SRAM bitcells, respectively. Additionally, WARD 9T cell demonstrates a substantial reduction in read delay by 1.56x/1.56x/8.44x compared to 11T/8T positive feedback controlled (PFC)/9T SB SRAM bitcells, respectively. To validate its performance, the WARD 9T SRAM bitcell undergoes evaluation across various supply voltages, process corners at varied temperature ranges, considering the impact of voltage threshold variations on transistor mismatch through Monte Carlo simulations. Various parameters like write margin and write 1 delay are validated against 30 mV sigma variation in threshold voltage for 2k data points at three different temperatures. The latter undergoes further evaluation at different process corners. The comparative analysis includes various pre-existing SRAM cells, highlighting the superior performance of the WARD 9T cell. Ayush Dahiya, Vansh Singhal, Poornima Mittal |
ACM Trans. Design Autom. Electr. Syst. | 3 |
| 2024 | Realizing In-Memory Computing using Reliable Differential 8T SRAM for Improved LatencyabstractTraditional von Neumann computing architectures suffer from high energy and lower speed as compared to the requirements of modern applications like those required in neural network accelerators. A modified differential eight transistor (8 + T) static random access memory (SRAM)-based in-memory computing (IMC) structure was presented for realizing bit-wise Boolean logic operations. The 8 + T SRAM-IMC is designed at the 32 nm technology node with throughput of 2.1849, 2.4815, 2.5795, 2.6240, 2.6495, 2.6619, 2.6690, 2.6732, and 2.6749 giga outputs per second for 0.5 to 1.3 V supply voltage range, respectively. The differential 8T cell used to implement logic operations supports NAND and NOR operations with minimal overhead while also performing the standard storage operation with added stability over the conventional 6T and 8T SRAM cells. The SRAM-IMC offers reliable Boolean logic operations by using asymmetric sensing strategy for all process corners, TT, SS, SF, FS, and FF for an operating temperature range of 220 K to 400 K. Monte Carlo simulation considering global threshold voltage deviation of 50 mV was performed for various operating conditions to study the impact of variations on design parameters such as latency. Ayush Dahiya, Poornima Mittal, Rajesh Rohilla |
ACM Trans. Design Autom. Electr. Syst. | 2 |
| 2023 | Modified Decoupled Sense Amplifier with Improved Sensing Speed for Low-Voltage Differential SRAMabstractA modified decoupled sense amplifier (MDSA) and modified decoupled sense amplifier with NMOS foot-switch is proposed for improved sensing in differential SRAM for low-voltage operation at the 22-nm technology node. The MDSA and MDSANF both offer notable improvements to read delay over conventional voltage and current sense amplifiers. At an operating voltage of 0.8 V, the MDSA exhibited a reduced delay of 28.6%, 41.79%, 37.74%, and 30.94% compared to modified clamped sense amplifier (MCSA), double tail sense amplifier (DTSA), modified hybrid sense amplifier (MHSA), and conventional latch-type sense amplifier (LSA), respectively. Similarly, the MDSANF demonstrated a delay reduction of 26.13%, 39.78%, 35.58%, and 28.55% over MCSA, DTSA, MHSA, and LSA, respectively. To validate the performance, the MDSA and MDSANF are evaluated using the variation in delay and power consumption across various supply voltages, process corners, input differential bit line voltage (ΔV BL ), bit line capacitance (C BL ), and the sizing of decoupling transistors. Monte Carlo simulations were conducted to analyse the impact of voltage threshold variations on transistor mismatch which leads to an increased occurrence of read failures and a decline in SRAM yield. The performance analysis of various voltage and current sense amplifiers is presented along with MDSA and MDSANF. Area consideration for selection of sensing scheme is important and as such layout of MDSA and MDSANF was performed conforming to the design rules and estimated area for MDSA is 0.297 μm 2 whereas MDSANF occupies 0.5192 μm 2 . Ayush Dahiya, Poornima Mittal, Rajesh Rohilla |
ACM Trans. Design Autom. Electr. Syst. | 2 |
| 2023 | A Switching NMOS Based Single Ended Sense Amplifier for High Density SRAM ApplicationsabstractThe demand for single ended static random access memory is growing, driven by the decreasing technology node and increasing processing load. This mandates the need for a single ended sense amplifier to be used along with the memory. Consequently, a single ended latch based sense amplifier is proposed in this article for high-speed, low power application. The sense amplifier is designed at a 32 nm technology node and its functioning is analyzed at 1 V supply voltage, while the environment temperature is maintained at 27 °C. It is analyzed for its delay, temperature tolerance, variability tolerance, and area occupancy. The delay requirement of 0.2 ns for the proposed scheme is significantly lower in comparison to its other counter parts. While, its false read time is 0.3μs. In terms of power consumption, the proposed sensing topology is marginally higher than SPSS, but its leakage power is 1.4 times less than SPSS. The major advantage of the proposed SA is its reduced area footprint of 7.65 μm 2 , which is 1.78 times better than the best pre-existing topology in terms of area. Bhawna Rawat, Poornima Mittal |
ACM Trans. Design Autom. Electr. Syst. | 2 |
| 2023 | A Reconfigurable 7T SRAM Bit Cell for High Speed, Power Saving and Low Voltage ApplicationabstractThe decreasing operational voltage and scaled technology node for memory designing has widened the gap between two crucial parameters for an SRAM – delay and power. As the demand for internet of things is increasing, the need for round the clock connectivity is increasing. This mandates designing a cell with a capability to switch between low power and high speed operation. Thus, this paper presents the design of dual mode operational 7T cell that can switch between single port and dual port configuration. The proposed reconfigurable cell can operate as single port or dual port cell single ended 7T cell. The reconfigurability in the cell is realized using control signals. The noise stability of the bit cell is obtained to be 333, 333, and 470 mV for read, hold, and write modes, respectively. The robustness of the cell against temperature variation, process variation and voltage variation is also analyzed. The performance variation in each parameter will not have a dramatic impact as it is within manageable limit. Its write time is 0.14 ns, while 5 ps are required for a successful read operation. The dual port configuration of the cell supports pipelining and thus operates faster than its single port configuration. Bhawna Rawat, Poornima Mittal |
ACM Trans. Design Autom. Electr. Syst. | 2 |
| 2021 | Modeling and Analysis of High-Performance Triple Hole Block Layer Organic LED Based Light Sensor for Detection of Ovarian CancerabstractIn this paper a novel triple hole block layer (HBL) structure of the OLED is proposed that depicts an enhanced luminescence of 25285 cd/m2with an improvement of 47% over multilayered OLED architecture. It also owes 74% improvement in luminous power efficiency. An in-depth numerical analysis based on Poisson and drift diffusion equation is undertaken and validated against the internal device analysis. The analysis results highlight an enhanced recombination rate within the proposed device. High electron injection and efficient hole blocking contributes to improved recombination rate. Triple HBL OLED is therefore used for diagnosis of ovarian cancer. The device illustrated good response towards varying wavelengths generating a maximum photo current value of 93 mA. A healthy person can be differentiated from an oncological cancer patient based on fluorescence produced by their urine. The fluorescence values for healthy person and oncological cancer patient are in the range of 420 and 440 nm, correspondingly. The cathode current produced by OLED corresponding to these two wavelengths are 5 and 1 mA respectively. Hence, the proposed device can successfully diagnose the ovarian cancer patient. Further, the methodology proposed for diagnosis of ovarian cancer can help in developing a portable, flexible low cost biomedical sensor. Shubham Negi, Poornima Mittal |
IEEE Trans. Circuits Syst. I Regul. Pap. | 2 |