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Gene Cantwell

dblp:122/4231 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2010
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 100%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › semiconductor device fabrication
semiconductor growth
0.112010
Bulk ZnO: Current Status, Challenges, and Prospects · Proc. IEEE 2010
Integrated circuit design
optoelectronic devices
0.012010
Bulk ZnO: Current Status, Challenges, and Prospects · Proc. IEEE 2010

Methods — techniques the papers use, named apart from their topics

seeded vapor transport growth · 0.1melt growth · 0.1hydrothermal growth · 0.1
YearPublicationVenuePosition
2010 Bulk ZnO: Current Status, Challenges, and Prospects
abstract
Rediscovered in the last decade, zinc oxide (ZnO) shows a great potential for many optoelectronics and to some extent microelectronics applications. However, a clear majority of effort expended in this fast developing field has been limited to heteroepitaxial structures grown on foreign substrates with lattice-parameter and thermal-expansion mismatch with ZnO which is detrimental. Recognizing the importance, the effort has shifted to include developing technologies capable of producing freestanding ZnO wafers in large-scale for ZnO based device applications, which is the subject matter of this manuscript. Three competing approaches - hydrothermal method, melt growth (modifications of the well known Bridgman technique), and seeded vapor transport growth - have now reached or are approaching commercial viability. In this article, we discuss the progress, outstanding problems, and prospects of these growth methods employed for commercial manufacturing of ZnO wafers.
Vitaliy Avrutin, Gene Cantwell, Jizhi Zhang, J. J. Song, Donald J. Silversmith, Hadis Morkoç
Proc. IEEE2