Sub-threshold designs play an important role in energy-constrained applications. In those designs, path delays depend exponentially on threshold voltage/temperature. As such, dynamic configurations at runtime are desired for best trade-off between operating power and performance. Unfortunately, most existing works only consider either process or temperature variations but not both, resulting in sub-optimal configurations or even functional failures. Moreover, little study has been performed on the graceful degradation of sub-threshold designs, which is important in the presence of drastic delay variations. Towards this, we present a novel critical path monitor based dynamic voltage scaling scheme. Considering both process and temperature variations, it minimizes the operating power under a given timing error probability (TEP) bound. An exact method to decide the optimal switching thresholds is also proposed. Experimental results on 45nm industrial designs show that with only 1% TEP, our scheme can reduce the operating power by up to 75.3% compared with the constant voltage scheme. To the best of the authors' knowledge, this is the very first work on dynamic configuration for graceful degradation in sub-threshold designs.

Through Silicon Via (TSV) is a critical enabling technique in three-dimensional integrated circuits (3D ICs). However, it may suffer from many reliability issues. Various fault-tolerance mechanisms have been proposed in literature to improve yield, at the cost of significant area overhead. In this paper, we focus on the structure that uses one spare TSV for a group of original TSVs, and study the optimal assignment of spare TSVs under yield and timing constraints to minimize the total area overhead. We show that such problem can be modeled through constrained graph decomposition. An efficient heuristic is further developed to address this problem. Experimental results show that under the same yield and timing constraints, our heuristic can reduce the area overhead induced by the fault-tolerance mechanisms by up to 38%, compared with a seemingly more intuitive nearest-neighbor based heuristic.

Retention registers have been widely used in power gated designs to store data during sleep mode. However, their excessive area and leakage power render it imperative to minimize the total retention storage size. The current industry practice replaces all registers with singlebit retention ones, which significantly limits the design freedom and yields suboptimal designs. Toward this, for the first time in the literature, we propose the concept and the design of multibit retention registers, with which only selected registers need to be replaced. The technique can significantly reduce the number of bits that need to be stored and thus the leakage power, but needs several clock cycles for mode transition. In addition, an efficient assignment algorithm is developed to minimize the total retention storage size subject to mode transition latency constraint. Experimental results show that our framework on average can reduce the leakage power in sleep mode by 84% along with additional mode transition latency of 6 to 11 clock cycles, compared with the singlebit retention register-based design.

Retention registers have been widely used in power gated design to store data during sleep mode. Since they consume much larger area and power than normal registers, it is imperative to minimize the total retention storage size. The current industry practice only replace all registers with single-bit retention ones, which significantly limits the design freedom and results in excessive area and power overhead. Towards this, for the first time in literature, we propose the concept of multi-bit retention register, with which only selected registers need to be replaced. It can significantly reduce the number of bits that need to be stored and thus the area and leakage power, but needs several clock cycles for mode transition. In addition, an efficient assignment algorithm is developed to minimize the total retention storage size subject to mode transition latency constraint. Experimental results show that our framework on average can reduce the leakage power in sleep mode and the retention storage area by 66.03%, compared with the single-bit retention register based design.