Demo Data from EDBT 2026 / reviewers in the wild / expert
Chung-Hseng Kuo
dblp:126/2786
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1997
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 1 · 1 first-authorSystems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Embedded and real-time systems · 50% Electronic design automation · 50% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Embedded and real-time systems
cyber-physical system platforms |
0.0 | 1 | 1997 | Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems · ICRA 1997 |
Electronic design automation › hardware verification and test
fault diagnosis |
0.0 | 1 | 1997 | Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems · ICRA 1997 |
Embedded and real-time systems › manufacturing systems
flexible manufacturing systems |
0.0 | 1 | 1997 | Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems · ICRA 1997 |
Electronic design automation
statistical process control |
0.0 | 1 | 1997 | Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systems · ICRA 1997 |
Methods — techniques the papers use, named apart from their topics
colored timed petri net · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1997 | Colored timed Petri net based statistical process control and fault diagnosis to flexible manufacturing systemsabstractThe quality consistence and machine utilization of a flexible manufacturing system (FMS) strongly depend on the statistical process control (SPC) and the correct fault diagnosis of equipment. An FMS can be modelled by the colored timed Petri net (CTPN). However, most CTPN models of FMS lack the activities of SPC and fault diagnosis, and they lead to incomplete FMS CTPN models. In this paper, the CTPN-based SPC and fault diagnosis models are proposed to model the FMS SPC and fault diagnosis behaviors. Since the models depend on the measured data from the inspection machines and the sensor data from the devices, the CTPN-based SPC and fault diagnosis models can be incorporated into the production CTPN models to give a complete model of FMS activities. It is shown that the CTPN-based fault diagnosis is easy to model, and the results are straightforward. Chung-Hseng Kuo, Han-Pang Huang |
ICRA | 1 |